Patents by Inventor Do Quyen Phan

Do Quyen Phan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Fringe deflectometry apparatus and method
    Patent number: 6043885
    Abstract: A fringe deflectometry apparatus illuminates an optical component to be measured using radiation with a known wavefront, deflects the radiation after it has been reflected or transmitted by the optical component to be measured, and materializes a reference ray. Transverse aberration of the reference ray after reflection or transmission by the optical component is measured. A deflectometry method using the apparatus enables an absolute phase reference to be provided.
    Type: Grant
    Filed: January 8, 1998
    Date of Patent: March 28, 2000
    Assignee: Essilor International
    Inventors: Denis Mazuet, Patrick Bertrand, Do Quyen Phan, Werner Mohr