Patents by Inventor Dohyeon HAN

Dohyeon HAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • OVERLAY MEASURING METHOD AND SYSTEM, AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE USING THE SAME
    Publication number: 20240133683
    Abstract: In an overlay measurement method, an overlay mark having programmed overlay values is provided. The overlay mark is scanned with an electron beam to obtain a voltage contrast image. A defect function that changes according to the overlay value is obtained from voltage contrast image data. Self-cross correlation is performed on the defect function to determine an overlay.
    Type: Application
    Filed: September 5, 2023
    Publication date: April 25, 2024
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Inho KWAK, Jinsun KIM, Moosong LEE, Seungyoon LEE, Jeongjin LEE, Chan HWANG, Dohyeon PARK, Yeeun HAN
  • CATALYST STRUCTURE HAVING A CORE-SHELL STRUCTURE WITH A CONTROLLED SURFACE MORPHOLOGY AND PREPARATION METHOD THEREOF
    Publication number: 20230234031
    Abstract: The present invention provides a catalyst structure having a core-shell structure comprising a core comprising a metal and a shell formed on the core, wherein the shell comprises a metal hydroxide crystal or a metal oxide crystal formed uniformly in shape and size perpendicular to the surface of the metal, wherein the metal hydroxide crystal or the metal oxide crystal have a 2D structure or a 1D structure, and preparation method thereof.
    Type: Application
    Filed: January 25, 2023
    Publication date: July 27, 2023
    Inventors: Doohwan LEE, Dohyeon HAN, Jieun KIM