Patents by Inventor Dolf Timmerman

Dolf Timmerman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210091268
    Abstract: A color tunable light emission diode in which the color tone of the emission color changes by controlling the injection current, which has an active layer sandwiched between a p-type layer and an n-type layer on a substrate, and the active color layer is formed by doping Eu and Mg to an AlGaInN-based material which is GaN, InN, AlN or a mixed crystal of any two or more of them; and a micro LED display, wherein its display unit is formed by integrating image pixels having the above color tunable light emission diode are provided; and a light emitting semiconductor device technology capable of providing an ultra-small and high definition micro LED display can be provided.
    Type: Application
    Filed: April 14, 2020
    Publication date: March 25, 2021
    Inventors: Volkmar Dierolf, Brandon Mitchell, Ruoqiao Wei, Yasufumi Fujiwara, Tomasz Gregorkiewicz, Shuhei Ichikawa, Jun Tatebayashi, Dolf Timmerman
  • Patent number: 10777383
    Abstract: A method and system are disclosed for observing and aligning a beam of light in the sample chamber of a charged particle beam (CPB) system, such as an electron microscope or focused ion beam system. The method comprises providing an imaging aid inside the sample chamber with a calibration surface configured such that when illuminated by light, and simultaneously illuminated by a CPB, the intensity of the secondary radiation induced by the CPB is different in regions also illuminated by light relative to regions with lower light illumination levels, thereby providing an image of the light beam on the calibration surface. The image of the light beam may be used to align the light beam to the charged particle beam.
    Type: Grant
    Filed: July 6, 2018
    Date of Patent: September 15, 2020
    Assignee: FEI Company
    Inventors: Cameron James Zachreson, Dolf Timmerman, Milos Toth, Jorge Filevich, Steven Randolph, Aurelien Philippe Jean Maclou Botman
  • Publication number: 20190013178
    Abstract: A method and system are disclosed for observing and aligning a beam of light in the sample chamber of a charged particle beam (CPB) system, such as an electron microscope or focused ion beam system. The method comprises providing an imaging aid inside the sample chamber with a calibration surface configured such that when illuminated by light, and simultaneously illuminated by a CPB, the intensity of the secondary radiation induced by the CPB is different in regions also illuminated by light relative to regions with lower light illumination levels, thereby providing an image of the light beam on the calibration surface. The image of the light beam may be used to align the light beam to the charged particle beam.
    Type: Application
    Filed: July 6, 2018
    Publication date: January 10, 2019
    Applicant: FEI Company
    Inventors: Cameron James Zachreson, Dolf Timmerman, Milos Toth, Jorge Filevich, Steven Randolph, Aurelien Philippe Jean Maclou Botman
  • Publication number: 20100126586
    Abstract: A photovoltaic device is provided comprising an energy conversion material. The energy conversion material comprises nanosized semiconductor quantum structures comprising a first quantum dot and a second quantum dot. The first quantum dot has a first size, and the second quantum dot has a second size. The separation of the first and second quantum dots is of the same order of magnitude as the first or second size or smaller, such that, by irradiating the first quantum dot with a photon for producing one or more excitons in the first quantum dot, one or more further excitons are also produced in the second quantum dot.
    Type: Application
    Filed: November 21, 2008
    Publication date: May 27, 2010
    Applicant: University of Amsterdam
    Inventors: Dolf Timmerman, Tomasz Gregorkiewicz