Abstract: A device under test—DUT—, comprising the steps of receiving a first data sequence from the DUT in response to a first stimulus signal, wherein the data of a plurality of internal data sequences of the DUT is compressed into the first data sequence, comparing the first data sequence with expected data and for detecting errors in the first data sequence, and providing a second stimulus signal to the DUT in order to instruct the DUT to generate a second data sequence that comprises uncompressed data of the plurality of the internal data sequences at the positions where the errors have been detected.

Abstract: Systems and methods for adaptively compressing test data are disclosed. One such method comprises the steps of examining a test data file that includes a first plurality of data units corresponding to a first plurality of DUT pins and a second plurality of data units corresponding to a second plurality of DUT pins, compressing the first plurality of data units using a first compression technique, and compressing the second plurality of data units using a second compression technique.

Abstract: In one embodiment, an electronic device is tested using automated test equipment (ATE) by 1) storing different vectors of scan load data in memory of the ATE; 2) storing a scan unload subroutine in the memory of the ATE; 3) stimulating the electronic device by retrieving the different vectors of scan load data and applying them to the electronic device; and 4) capturing responses to the different vectors by repeatedly calling the scan unload subroutine, and in response thereto, storing different vectors of scan unload data in the memory.

Abstract: In one embodiment, a method provides scan patterns to an electronic device having BIST hardware. The BIST hardware has production and diagnostic test modes, and the device outputs one or more response signatures in the production test mode and outputs raw response data in the diagnostic test mode. In production test mode, the method uses ATE to 1) provide a first series of scan test patterns to the BIST hardware, and 2) capture and compare response signatures to expected response signatures, to identify a number of failing scan test patterns. The method then uses the ATE to identify a number of unique labels associated with the failing patterns. In diagnostic test mode, the method uses the ATE to 1) provide a second series of scan test patterns to the BIST hardware, and 2) capture raw response data. The scan test patterns in the second series correspond to the identified labels.

Abstract: A device under test—DUT—, comprising the steps of receiving a first data sequence from the DUT in response to a first stimulus signal, wherein the data of a plurality of internal data sequences of the DUT is compressed into the first data sequence, comparing the first data sequence with expected data and for detecting errors in the first data sequence, and providing a second stimulus signal to the DUT in order to instruct the DUT to generate a second data sequence that comprises uncompressed data of the plurality of the internal data sequences at the positions where the errors have been detected.

Abstract: In one embodiment, an electronic device is tested using automated test equipment (ATE) by 1) storing different vectors of scan load data in memory of the ATE; 2) storing a scan unload subroutine in the memory of the ATE; 3) stimulating the electronic device by retrieving the different vectors of scan load data and applying them to the electronic device; and 4) capturing responses to the different vectors by repeatedly calling the scan unload subroutine, and in response thereto, storing different vectors of scan unload data in the memory.

Abstract: In one embodiment, a method provides scan patterns to an electronic device having BIST hardware. The BIST hardware has production and diagnostic test modes, and the device outputs one or more response signatures in the production test mode and outputs raw response data in the diagnostic test mode. In production test mode, the method uses ATE to 1) provide a first series of scan test patterns to the BIST hardware, and 2) capture and compare response signatures to expected response signatures, to identify a number of failing scan test patterns. The method then uses the ATE to identify a number of unique labels associated with the failing patterns. In diagnostic test mode, the method uses the ATE to 1) provide a second series of scan test patterns to the BIST hardware, and 2) capture raw response data. The scan test patterns in the second series correspond to the identified labels.

Abstract: Systems and methods for adaptively compressing test data are disclosed. One such method comprises the steps of examining a test data file that includes a first plurality of data units corresponding to a first plurality of DUT pins and a second plurality of data units corresponding to a second plurality of DUT pins, compressing the first plurality of data units using a first compression technique, and compressing the second plurality of data units using a second compression technique.