Patents by Inventor Dominic HAERKE

Dominic HAERKE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9921287
    Abstract: A method for calibrating a test apparatus, having a first and a second directional coupler, for gauging a two-port test object that has a first port and a second port in a calibration plane, wherein for the purpose of calibrating the test apparatus a vectorial network analyzer having a 1st-6th test port is connected to the first and second ports in the calibration plane such that the first and second test ports are connected to respective port in the calibration plane, the third and fourth test ports are connected to the first directional coupler and the fifth and sixth test ports are connected to the second directional coupler via a respective waveguide for electromagnetic waves. For different calibration standards, scatter parameters are determined for each desired frequency point. For the different calibration standards, corrections to the scatter matrix are made in order to obtain a corrected scatter matrix.
    Type: Grant
    Filed: August 25, 2014
    Date of Patent: March 20, 2018
    Assignee: Rosenberger Hochfrequenztechnik GmbH & Co. KG
    Inventors: Christian Zietz, Dominic Haerke
  • Publication number: 20160209488
    Abstract: A method for calibrating a test apparatus, having a first and a second directional coupler, for gauging a two-port test object that has a first port and a second port in a calibration plane, wherein for the purpose of calibrating the test apparatus a vectorial network analyzer having a 1st-6th test port is connected to the first and second ports in the calibration plane such that the first and second test ports are connected to respective port in the calibration plane, the third and fourth test ports are connected to the first directional coupler and the fifth and sixth test ports are connected to the second directional coupler via a respective waveguide for electromagnetic waves. For different calibration standards, scatter parameters are determined for each desired frequency point. For the different calibration standards, corrections to the scatter matrix are made in order to obtain a corrected scatter matrix.
    Type: Application
    Filed: August 25, 2014
    Publication date: July 21, 2016
    Inventors: Christian ZIETZ, Dominic HAERKE