Patents by Inventor Dominic Plunkett

Dominic Plunkett has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing of integrated circuits using boundary scan
    Patent number: 7631235
    Abstract: Circuit testing equipment comprising a computer (110) having stored thereon a boundary scan description language (BSDL) file (111), a netlist (112) and a connections list (113). An adapter (105) connects the computer to a boundary scan bus of a circuit (120) to be tested. The computer is arranged to parse and compile the BSDL file, the netlist and the connections list to generate a data structure which, when combined with a test script (114), permits execution of the test script from the computer through the boundary scan bus. The test script can be IC-specific such that it is valid for a particular IC independent of the circuit in which the IC is located.
    Type: Grant
    Filed: January 29, 2008
    Date of Patent: December 8, 2009
    Assignee: Midas Yellow Ltd.
    Inventor: Dominic Plunkett
  • Testing of integrated circuits using boundary scan
    Publication number: 20080215942
    Abstract: Circuit testing equipment comprising a computer (110) having stored thereon a boundary scan description language (BSDL) file (111), a netlist (112) and a connections list (113). A connector (112) connects the computer to a boundary scan bus of a circuit (120) to be tested. The computer is arranged to parse and compile the BSDL file, the netlist and the connections list to generate a data structure which, when combined with a test script (114), permits execution of the test script from the computer through the boundary scan bus. The test script can be IC-specific such that it is valid for a particular IC independent of the circuit in which the IC is located.
    Type: Application
    Filed: January 29, 2008
    Publication date: September 4, 2008
    Inventor: Dominic Plunkett
  • Testing of integrated circuits using boundary scan
    Publication number: 20050097416
    Abstract: Circuit testing equipment comprising a computer (110) having stored thereon a boundary scan description language (BSDL) file (111), a netlist (112) and a connections list (113). An adapter (105) connects the computer to a boundary scan bus of a circuit (120) to be tested. The computer is arranged to parse and compile the BSDL file, the netlist and the connections list to generate a data structure which, when combined with a test script (114), permits execution of the test script from the computer through the boundary scan bus. The test script can be IC-specific such that it is valid for a particular IC independent of the circuit in which the IC is located.
    Type: Application
    Filed: October 31, 2003
    Publication date: May 5, 2005
    Inventor: Dominic Plunkett