Patents by Inventor Dominique Langlois Demers

Dominique Langlois Demers has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9733217
    Abstract: The invention relates to a method for providing a structural condition of a structure, comprising providing an excitation wave generator; providing an excitation wave sensor; injecting an excitation burst wave into the structure using the excitation wave generator; obtaining a measured propagated excitation burst wave using the excitation wave sensor; correlating the measured propagated excitation burst wave with one of a plurality of theoretical dispersed versions of the excitation burst wave; and providing an indication of the structural condition of the structure corresponding to the correlated measured propagated excitation burst wave. The method may offer a better localization of the reflection points and thus of the potential defects present in a structure under inspection, when compared with a group velocity-based or time-of-flight (ToF) approach. The method may be particularly useful for structural health monitoring (SHM) and Non-Destructive Testing (NDT).
    Type: Grant
    Filed: March 4, 2011
    Date of Patent: August 15, 2017
    Assignee: Scopra Sciences et GĂ©nie s.e.c.
    Inventors: Patrice Masson, Philippe Micheau, Nicolas Quaegebeur, Dominique Langlois Demers
  • Publication number: 20130055816
    Abstract: The invention relates to a method for providing a structural condition of a structure, comprising providing an excitation wave generator; providing an excitation wave sensor; injecting an excitation burst wave into the structure using the excitation wave generator; obtaining a measured propagated excitation burst wave using the excitation wave sensor; correlating the measured propagated excitation burst wave with one of a plurality of theoretical dispersed versions of the excitation burst wave; and providing an indication of the structural condition of the structure corresponding to the correlated measured propagated excitation burst wave. The method may offer a better localization of the reflection points and thus of the potential defects present in a structure under inspection, when compared with a group velocity-based or time-of-flight (ToF) approach. The method may be particularly useful for structural health monitoring (SHM) and Non-Destructive Testing (NDT).
    Type: Application
    Filed: March 4, 2011
    Publication date: March 7, 2013
    Inventors: Patrice Masson, Philippe Micheau, Nicolas Quaegebeur, Dominique Langlois Demers