Patents by Inventor Don BODGE

Don BODGE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8634304
    Abstract: An Ethernet cable used with an Ethernet test-set allows a single connection to an Ethernet port of a network element while maintaining individual connections to separate ports on the test-set. The far-end of the signal path is a single Ethernet cable port having its transmit and receive pins interconnected. The far-end port interconnections cause a test signal which has traveled to the far-end port to be returned to the test-set and to be receive in a test-set port other than the originating port Two signal paths can be simultaneously tested with the same test-kit. Interconnections between the test-set ports by way of the cable maintain a “no-signal”alarm disabled, which otherwise would be energized because there is no signal being received in the port from which the test signal originated.
    Type: Grant
    Filed: October 23, 2009
    Date of Patent: January 21, 2014
    Assignee: Verizon Patent and Licensing Inc.
    Inventors: Jeffrey Motter, Steven Franks, Michael Pollock, Don Bodge
  • Publication number: 20110095767
    Abstract: An Ethernet cable for use with an Ethernet test-set which allows a single connection to an Ethernet port of a network element while maintaining individual connections to two separate ports on the test-set, thereby allowing a successful test of a signal path in an Ethernet network to be conducted when the far-end of the signal path is a single Ethernet cable port having its transmit and receive pins interconnected. The far-end port interconnections cause a test signal which has traveled to the far-end port to be returned to the test-set and, in view of the cable configuration, to be received in a test-set port other than the port from which the signal test signal originated. Test-sets do not permit test signals to be returned to ports from which they originate. In an embodiment, two signal paths can be simultaneously tested with the same test-kit.
    Type: Application
    Filed: October 23, 2009
    Publication date: April 28, 2011
    Applicant: VERIZON PATENT AND LICENSING INC.
    Inventors: Jeffrey MOTTER, Steven FRANKS, Michael POLLOCK, Don BODGE