Patents by Inventor Don Goddard

Don Goddard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4701695
    Abstract: Test circuitry is included in a PROM memory for detecting shorts between bit lines and word lines and shorts or leaks in a memory cell. The circuitry enables a selected positive voltage to be applied across all memory cells in the memory so that the existence of leaky memory cells or shorts in the memory can be detected during testing. The test circuitry has no appreciable effect on the memory during normal operation of the memory.
    Type: Grant
    Filed: February 14, 1986
    Date of Patent: October 20, 1987
    Assignee: Monolithic Memories, Inc.
    Inventors: Albert Chan, Mark Fitzpatrick, Don Goddard, Robert J. Bosnyak, Cyrus Tsui
  • Patent number: 4595875
    Abstract: Test circuitry is included in a PROM memory for detecting shorts between bit lines and word lines and shorts or leaks in a memory cell. The circuitry enables a selected positive voltage to be applied across all memory cells in the memory so that the existance of leaky memory cells or shorts in the memory can be detected during testing. The test circuitry has no appreciable effect on the memory during normal operation of the memory.
    Type: Grant
    Filed: December 22, 1983
    Date of Patent: June 17, 1986
    Assignee: Monolithic Memories, Incorporated
    Inventors: Albert Chan, Mark Fitzpatrick, Don Goddard, Robert J. Bosnyak, Cyrus Tsui