Patents by Inventor Donald A. Chernoff

Donald A. Chernoff has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20050284717
    Abstract: An apparatus and method for transporting clothing comprising a wheeled suitcase and a detachable garment bag. The garment bag is adapted to wrap around outside panels of the suitcase and is held snuggly against the suitcase by a fastener system including connectively interlocking clips or the like. Auxiliary hook and loop strips ensure that the garment bag is securely held on the suitcase. The wheeled suitcase, in its generally upright position, includes an upper end and lower end. The upper end has an opening free of the wrapped garment bag affording ready access. Corners of the suitcase are rounded to facilitate gentle wrapping such that clothing within the garment bag is not subject to folding or wrinkling. The suitcase is slightly smaller than the size limited by airline regulations for carry-on luggage. Thus, when wrapped with the unique garment bag, the combined suitcase and garment bag will not exceed regulations.
    Type: Application
    Filed: August 31, 2005
    Publication date: December 29, 2005
    Inventor: Donald Chernoff
  • Patent number: 5825670
    Abstract: The present invention allows for calibration of a scanning probe microscope under computer control. The present invention comprehends either the removal of nonlinear artifacts in the microscope output data after measurement has been taken (a off-line process), or the correction of nonlinear movements in the microscope scanner such that the scanner moves in a linear fashion during measurement (a realtime process). The realtime process may be operated in both an open-loop and a closed-loop process. The processes of the present invention uses an average cross-section of the scan in order to simplify the calculation and to improve the signal-to-noise ratio. Interpolation methods and centroid calculations are used to locate features on the scanned sample to subpixel precision.
    Type: Grant
    Filed: March 5, 1997
    Date of Patent: October 20, 1998
    Assignee: Advanced Surface Microscopy
    Inventors: Donald A. Chernoff, Jason D. Lohr
  • Patent number: 5644512
    Abstract: The present invention allows for calibration of a scanning probe microscope under computer control. The present invention comprehends either the removal of nonlinear artifacts in the microscope output data after measurement has been taken (a off-line process), or the correction of nonlinear movements in the microscope scanner such that the scanner moves in a linear fashion during measurement (a realtime process). The realtime process may be operated in both an open-loop and a closed-loop process. The processes of the present invention uses an average cross-section of the scan in order to simplify the calculation and to improve the signal-to-noise ratio. Interpolation methods and centroid calculations are used to locate features on the scanned sample to subpixel precision.
    Type: Grant
    Filed: March 4, 1996
    Date of Patent: July 1, 1997
    Assignee: Advanced Surface Microscopy, Inc.
    Inventors: Donald A. Chernoff, Jason D. Lohr