Abstract: This is related to a logic circuit which requires a double clocking latch during testing of the circuit to prevent race or flushing of the scan rings from occuring during the test mode and yet can be operated to capture and hold output data during the operation mode with stable data inputs. The preferred embodiment is a programmable latching circuit comprising a double ended cross coupled circuit having an input and an output and having first and second programmable legs and a third non-programmable leg with the first programmable leg cross coupled to the third leg and the second programmable leg being switchably cross coupled to the third leg.

Abstract: A transistor array arrangement for providing high-density semiconductor logic circuits in double polysilicon technology is described. Semiconductor, for example, FET, logic circuits have four independent but simultaneously accessible FET devices which are formed by intersecting sets of polysilicon gate lines. The four FET devices share a common first diffusion, for example a source, surrounded by four logically independent second diffusions, for example drains. A three-bit decode device is made which includes this array design.