Abstract: A system and method for balancing flows of renal replacement fluid is disclosed. The method uses pressure controls and pressure sensing devices to more precisely meter and balance the flow of fresh dialysate and spent dialysate. The balancing system may use one or two balancing devices, such as a balance tube, a tortuous path, or a balance chamber.

Abstract: A method of testing EM lifetime has following steps. First, a pre-characterizing step is performed to obtain parameters such as TC(the critical temperature,), Wc (the critical line width), QGB(the activation energy of grain boundary diffusion) and QL(the activation energy of lattice diffusion) of a metal prior to the use of the test methodology for a new technology. Next, whether a real line width (W) of the metal is narrower or wider than WC is determined. For the narrower line widths, the diffusion mechanism is dominated by the Lattice diffusion only and corresponds to single activation energy (QL). A WLR isothermal test with a relatively high temperature, such as 400° C., can be implemented to reduce the test time to as short as a few seconds. The EM lifetime (t50) under normal operating condition can be directly obtained by conversion from Ttest to TC by using QL.

Abstract: A method for testing the reliability of a dielectric thin film. An exponential current ramp test is performed with a delay time to test the dielectric thin film. An exponential current ramp charge-to-breakdown distribution, which is represented by cumulative distribution failure percentage, is obtained. An exponential current ramp charge-to-breakdown at a cumulative distribution failure percentage is calculated. An exponential current ramp constant and a constant current stress constant at the cumulative distribution failure percentage are calculated. A constant current stress charge-to-breakdown at the cumulative distribution failure percentage is calculated by using a specified current density and the constant current stress constant at the cumulative distribution failure percentage. The constant current stress charge-to-breakdown at the cumulative distribution failure percentage is compared to a specified constant current stress charge-to-breakdown to determine the reliability of the dielectric thin film.