Patents by Inventor Donald Diangelo

Donald Diangelo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHOD AND APPARATUS FOR PROVIDING UNIAXIAL LOAD DISTRIBUTION FOR LAMINATE LAYERS OF MULTILAYER CERAMIC CHIP CARRIERS
    Publication number: 20070113950
    Abstract: An apparatus for providing uniform axial load distribution for laminate layers of multilayer ceramic chip carriers includes a base plate configured to support a plurality of green sheet layers thereon, the base plate having at least one resiliently mounted load support bar disposed adjacent outer edges of the base plate. The load support bar is mounted on one or more biasing members such that the top surface of the support bar extends above the top surface of the base plate by a selected distance.
    Type: Application
    Filed: November 22, 2005
    Publication date: May 24, 2007
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Jay Bunt, Donald Diangelo, Cristian Docu, Thomas Foley, Melvin Gottschalk, Lisa Hamilton, Thomas Kline, Mark LaPlante, Hsichang Liu, Sebastian Loscerbo, Govindarajan Natarajan, Olga Otieno, Renee Weisman
  • Method of improving production through cost of yield measurement
    Patent number: 7117060
    Abstract: The present invention provides a method for controlling production or manufacturing costs by obtaining yield measurements of unit manufacturing for a multiplicity of products or production lines having a plurality of processes which includes determining a started units number for the plurality of processes. The method further includes determining a cost per unit for each unit of the plurality of processes, and calculating an expected approved units number for the plurality of processes. The expected approved units number is calculated by multiplying the started units number by an expected yield measurement. The method next includes calculating an actual approved units number for each of the plurality of processes by multiplying the started units number by an actual yield measurement, and calculating an unapproved units number for each of the plurality of processes by subtracting the expected approved units number from the actual approved units number.
    Type: Grant
    Filed: January 26, 2001
    Date of Patent: October 3, 2006
    Assignee: International Business Machines Corporation
    Inventors: Thomas A. McPhee, Michael E. Cropp, Donald Diangelo, Alberto H. Gay, Carmella Pemberton, Joseph Saltarelli, Nicholas L. Volkringer, John J. DeMarco
  • Method of improving production through cost of yield measurement
    Publication number: 20020103560
    Abstract: The present invention provides a method for controlling production or manufacturing costs by obtaining yield measurements of unit manufacturing for a multiplicity of products or production lines having a plurality of processes which includes determining a started units number for the plurality of processes. The method further includes determining a cost per unit for each the unit of the plurality of processes, and calculating an expected approved units number for the plurality of processes. The expected approved units number is calculated by multiplying the started units number by an expected yield measurement. The method next includes calculating an actual approved units number for each of the plurality of processes by multiplying the started units number by an actual yield measurement, and calculating an unapproved units number for each of the plurality of processes by subtracting the expected approved units number from the actual approved units number.
    Type: Application
    Filed: January 26, 2001
    Publication date: August 1, 2002
    Applicant: International Business Machines Corporation
    Inventors: Thomas A. McPhee, Michael E. Cropp, Donald Diangelo, Alberto H. Gay, Carmella Pemberton, Joseph Saltarelli, Nicholas L Volkringer, John J DeMarco