Abstract: X-ray tomography systems and methods for imaging an aircraft part are disclosed herein. The systems include a part fixture, which is configured to support the aircraft part. The systems also include an x-ray source, which is configured to selectively emit x-rays, and an x-ray detector, which is configured to detect the x-rays. The systems further include a support structure that operatively supports the x-ray source and the x-ray detector such that x-rays emitted by the x-ray source travel along a beam path that is incident upon the x-ray detector and that passes through the aircraft part. The systems also include a rotary scanning structure, which is configured to selectively rotate the support structure about a scan axis, and a longitudinal scanning structure, which is configured to selectively translate the support structure along the scan axis. The methods include methods of utilizing the systems.

Abstract: X-ray tomography systems and methods for imaging an aircraft part are disclosed herein. The systems include a part fixture, which is configured to support the aircraft part. The systems also include an x-ray source, which is configured to selectively emit x-rays, and an x-ray detector, which is configured to detect the x-rays. The systems further include a support structure that operatively supports the x-ray source and the x-ray detector such that x-rays emitted by the x-ray source travel along a beam path that is incident upon the x-ray detector and that passes through the aircraft part. The systems also include a rotary scanning structure, which is configured to selectively rotate the support structure about a scan axis, and a longitudinal scanning structure, which is configured to selectively translate the support structure along the scan axis. The methods include methods of utilizing the systems.

Abstract: Apparatuses and systems comprising an additive manufacturing device and an associated terahertz inspection device for inspecting additively deposited layers in real time during or immediately following material deposition and parts made and inspected by the apparatuses and systems and their associated methods are disclosed herein.

Abstract: Apparatuses and systems comprising an additive manufacturing device and an associated terahertz inspection device for inspecting additively deposited layers in real time during or immediately following material deposition and parts made and inspected by the apparatuses and systems and their associated methods are disclosed herein.

Abstract: A method for inspecting an object. A support structure physically associated with a first sensor and a second sensor is moved to an area for inspection. The support structure is in a first configuration and the first sensor and the second sensor are positioned about an axis extending through the support structure when the support structure is in the first configuration. The support structure is changed from the first configuration to a second configuration. The first sensor and the second sensor are configured to generate information when the support structure is in the second configuration.

Abstract: A method for inspecting an object. A support structure physically associated with a first sensor and a second sensor is moved to an area for inspection. The support structure is in a first configuration and the first sensor and the second sensor are positioned about an axis extending through the support structure when the support structure is in the first configuration. The support structure is changed from the first configuration to a second configuration. The first sensor and the second sensor are configured to generate information when the support structure is in the second configuration.

Abstract: A system for the measurement of degradation of electrical wire insulation quality is described. The system includes a clamping device for engaging the electrical wire to be tested for insulation degradation, the clamping device comprising a channel formed therein for placement of the electrical wire, a plurality of plates placed proximate the channel, the plates electrically connected to generate a capacitance and placed proximate the channel such that the wire insulation provides a portion of a dielectric for the generated capacitance, and a measurement device operatively attached to the plurality of plates such that the measurement device is configured to indicate an amount of degradation associated with the wire insulation based on at least one of the measured capacitance and dissipation factor.

Abstract: A system for the measurement of degradation of electrical wire insulation quality is described. The system includes a clamping device for engaging the electrical wire to be tested for insulation degradation, the clamping device comprising a channel formed therein for placement of the electrical wire, a plurality of plates placed proximate the channel, the plates electrically connected to generate a capacitance and placed proximate the channel such that the wire insulation provides a portion of a dielectric for the generated capacitance, and a measurement device operatively attached to the plurality of plates such that the measurement device is configured to indicate an amount of degradation associated with the wire insulation based on at least one of the measured capacitance and dissipation factor.