Abstract: A high voltage step-up transformer incorporating dual insulating layers, a relatively thick, heat-resistant "TEFLON" layer exhibiting extremely low dielectric losses and a thinner epoxy layer having a tractive, non-skid outer surface supporting a large plurality of fine wire secondary winding turns.

Abstract: A laser target selector incorporating a flexible tension coil spring removeably mountable on an X-ray tube's projection portal for illuminating a target spot to allow adjusted aiming of the X-ray beam.

Abstract: An unusually lightweight and readily portable X-ray machine is achieved through the use of a multi-stage DC voltage multiplier combined with a multi-stage AC filament current stepdown transformer, incorporating unique components and subassemblies. Multi-prong clamping inter-stage connectors couple diode strings to plural capacitor array junctions and to conductors matching interstage DC potentials between multiplier stages and transformer stages. A high voltage input transformer for the multiplier incorporates dual insulating layers, a relatively thick, heat-resistant Teflon layer exhibiting extremely low dielectric losses and a thinner Epoxy layer having a tractive outer surface supporting a large plurality of fine wire secondary winding turns. A laser target selector removably mountable on the X-ray tube's projection portal illuminates a target spot to allow adjusted aiming of the X-ray beam.

Abstract: A power supply for producing excitation of an X-ray tube filament of an unusually lightweight and readily portable X-ray machine is achieved through the use of multiple voltage multiplying-rectifying stages powered by a transformer driven at 25 kHz. A four amp-four volt electrical current is applied across the X-ray tube filament by the use of a multi-stage filament transformer array driven at 33 kHz. The multi-stage filament transformer array is interconnected to the multiple voltage multiplying-rectifying stage so as to limit the voltage potential between stages. The use of 25 kHz and 33 kHz driving signals eliminates cross talk between signal producing circuits.

Abstract: Method and apparatus for ultrasonic non-destructive testing by the pulse echo method. The pulses received from flaws in a test object are supplied to a main branch circuit for amplification to produce a suitable flaw display and to a back echo branch circuit having a lower amplification such that the back echo signal does not saturate the amplifier. During a "flaw gate" period, the output from the main branch circuit is supplied through a high speed electronic switch to a display. At the conclusion of the flaw gate period, the switch is actuated to supply the back echo branch circuit output to the display. In this manner, the back echo signal may be monitored for additional flaw information.

Abstract: A function generator provides a voltage vs. time curve which is also applied to the oscilloscope and is adjusted by the operator to conform to the peak amplitudes of the displayed electrical pulses. During subsequent testing, this voltage function is applied to a control signal generator which, in accordance with a predetermined relationship, modifies the voltage function into a control signal which is applied to the receiver. The control signal varies the receiver gain with time to attenuate and equalize the displayed pulses to a preselected amplitude.The equalized pulses corresponding to the equal sized reflectors are dependent upon only the size of the reflector and are independent of the depth of the discontinuities within the test blocks. As a result of the adjustment to the receiver gain by the control signal, the magnitudes of all displayed echo pulses from workpieces subsequently tested by the system will be dependent only upon the sizes of the corresponding discontinuities in the workpieces.

Abstract: An ultrasonic nondestructive testing system of the pulse-echo type is disclosed including an echo-signal-translator exhibiting a bandwidth that is varied to achieve excellent near-surface resolution while affording deep inspection of an object under test.