Abstract: An inverted double dome double vacuum debulk tool having separable upper and lower chamber portions which can be assembled to form a vacuum chamber. In accordance with some embodiments, the top and bottom halves each comprise a circular cylindrical sidewall closed at one end by an inverted dome. The domes may be hemispherical or semi-elliptical with convex sides facing the chamber interior space. A base plate on which the composite patch rests is removable from the vacuum chamber. Various fittings pass electrical power and vacuum into the tool and sensor outputs out of the tool.

Abstract: An inverted double dome double vacuum debulk tool having separable upper and lower chamber portions which can be assembled to form a vacuum chamber. In accordance with some embodiments, the top and bottom halves each comprise a circular cylindrical sidewall closed at one end by an inverted dome. The domes may be hemispherical or semi-elliptical with convex sides facing the chamber interior space. A base plate on which the composite patch rests is removable from the vacuum chamber. Various fittings pass electrical power and vacuum into the tool and sensor outputs out of the tool.

Abstract: Disclosed are test structures for radio frequency (RF) power stress and characterization. Each test structure incorporates a single device and is selectively operated in either a stress mode, during which the device is stressed under RF power, or in an analysis mode, during which the impact of the applied stress on the performance of the device is characterized. During the stress mode, an input RF power signal is applied to the device through an RF signal input port and an output RF power signal is captured from the device at an RF signal output port. Depending upon the impedance value of the device at issue, the RF signal input port and the RF signal output port are connected to either the same terminal or opposing terminals and the need for impedance tuning is avoided. Also disclosed are test systems and methods for selectively controlling operation of such a test structure.

Abstract: Disclosed are test structures for radio frequency (RF) power stress and characterization. Each test structure incorporates a single device and is selectively operated in either a stress mode, during which the device is stressed under RF power, or in an analysis mode, during which the impact of the applied stress on the performance of the device is characterized. During the stress mode, an input RF power signal is applied to the device through an RF signal input port and an output RF power signal is captured from the device at an RF signal output port. Depending upon the impedance value of the device at issue, the RF signal input port and the RF signal output port are connected to either the same terminal or opposing terminals and the need for impedance tuning is avoided. Also disclosed are test systems and methods for selectively controlling operation of such a test structure.

Abstract: The invention relates to chemical compounds of the formula (I) or pharmaceutically acceptable salts thereof, which possess B-Raf inhibitory activity and are accordingly useful for their anti cancer activity and thus in methods of treatment of the human or animal body. The invention also relates to processes for the manufacture of said chemical compounds, to pharmaceutical compositions containing them and to their use in the manufacture of medicaments of use in the production of an anti-cancer effect in a warm blooded animal such as man.

Abstract: A system (10) for and method of testing a device under test (DUT) (12) having a plurality of probe pads (14) utilizing a dual probe technique to overcome contact resistance that may be present. The system comprises a plurality of sensing probes (30) and a plurality of forcing probes (32) arranged in pairs consisting of one sensing probe and one forcing probe. Each pair of sensing and forcing probes is provided for contacting one of the probe pads on the DUT. Each forcing probe is in electrical communication with a power supply (20) via a switching matrix (24), and each sensing probe is in electrical communication with a voltage meter (52) via the switching matrix. During testing, at least one of the power supplies provides a voltage to a corresponding forcing probe in contact with a particular probe pad.

Abstract: The present invention provides a power washing system capable of indoor and outdoor operation while remaining convenient for use by the consumer. The present invention provides a housing designed to move over surface areas to be cleaned and adapted for spraying and retrieving water under high pressure. The housing being equipped with one or more bulkhead fittings capable of receiving vacuum hoses. These vacuum hoses may be attached to the housing such that waste water created during cleaning operations may be recovered and drawn upwardly through the vacuum hoses. The housing is attached to a support member having a trigger member adapted to control water flow through one or more water hoses attached thereto.

Abstract: A method and apparatus for automated testing of a plurality of electrostatic discharge (ESD) devices on a wafer. The wafer has M padsets and N conductive pads on each padset, where m is at least 1, and n is at least 2, and each ESD device is conductively coupled to a unique plurality of pads of a padset of the M padsets. Testing sequences, under program control of a computer system, implement the testing of the ESD devices.

Abstract: A method and apparatus for automated testing of a plurality of electrostatic discharge (ESD) devices on a wafer. The wafer comprises M padsets and N conductive pads on each padset, wherein M is at least 1, wherein N is at least 2, and wherein each ESD device is conductively coupled to a unique plurality of pads of a padset of the M padsets. Testing sequences, under program control of a computer system, implement the testing of the ESD devices.

Abstract: A device, having circuits formed thereon, comprises a circuit including a frequency generator for generating a detectable radio frequency energy when powered and a power generator, coupled to the frequency generator, for generating power when exposed to light.

Abstract: A system (10) for and method of testing a device under test (DUT) (12) having a plurality of probe pads (14) utilizing a dual probe technique to overcome contact resistance that may be present. The system comprises a plurality of sensing probes (30) and a plurality of forcing probes (32) arranged in pairs consisting of one sensing probe and one forcing probe. Each pair of sensing and forcing probes is provided for contacting one of the probe pads on the DUT. Each forcing probe is in electrical communication with a power supply (20) via a switching matrix (24), and each sensing probe is in electrical communication with a voltage meter (52) via the switching matrix. During testing, at least one of the power supplies provides a voltage to a corresponding forcing probe in contact with a particular probe pad.

Abstract: A device, having circuits formed thereon, comprises a circuit including a frequency generator for generating a detectable radio frequency energy when powered and a power generator, coupled to the frequency generator, for generating power when exposed to light.

Abstract: A device, having circuits formed thereon, comprises a circuit including a frequency generator for generating a detectable radio frequency energy when powered and a power generator, coupled to the frequency generator, for generating power when exposed to light.