Patents by Inventor Donald J. Rigsby

Donald J. Rigsby has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for collecting data from semiconductor equipment
    Patent number: 8112400
    Abstract: A method for collecting data from semiconductor equipment includes selecting a plurality of data values to request from semiconductor equipment and assigning each of the data values to a chamber. Each chamber is associated with an engine that processes the data values in the associated chamber to detect a fault in the semiconductor equipment. The method also includes determining an order to receive the data values from the semiconductor equipment, and, after the order for the data values is determined, communicating a setup message requesting the semiconductor equipment to communicate the data values in the predetermined order. The method further includes receiving the data values from the semiconductor equipment and providing each of the received data values to the particular engine associated with the chamber of the data value.
    Type: Grant
    Filed: December 23, 2003
    Date of Patent: February 7, 2012
    Assignee: Texas Instruments Incorporated
    Inventors: Bing Ouyang, Gurshaman S. Baweja, Donald J. Rigsby, Jr.
  • System and method for controlling a vapor dryer process
    Patent number: 6643952
    Abstract: A system and method are disclosed including a vapor dryer chamber (12) with a lid (14). A heater (16) is disposed within the vapor dryer chamber to vaporize liquid drying medium (24), preferably isopropyl alcohol, in the bottom of the vapor dryer chamber (12). Cooling coils (18) disposed within an upper portion of the vapor drying chamber (12) condense the drying medium vapor. A vapor monitor assembly (30) is disposed within the vapor dryer chamber (12) to monitor the vapor concentration within vapor dryer chamber (12). A controller (40) is associated with the vapor monitor assembly (30) and evaluates vapor concentration measurements from the vapor monitor (38).
    Type: Grant
    Filed: November 1, 2002
    Date of Patent: November 11, 2003
    Assignee: Texas Instruments Incorporated
    Inventors: Neal T. Murphy, Claire Ching-Shan Jung, Daryl R. Koehl, Donald J. Rigsby
  • System and method for controlling a vapor dryer process
    Publication number: 20030056389
    Abstract: A system and method are disclosed including a vapor dryer chamber (12) with a lid (14). A heater (16) is disposed within the vapor dryer chamber to vaporize liquid drying medium (24), preferably isopropyl alcohol, in the bottom of the vapor dryer chamber (12). Cooling coils (18) disposed within an upper portion of the vapor drying chamber (12) condense the drying medium vapor. A vapor monitor assembly (30) is disposed within the vapor dryer chamber (12) to monitor the vapor concentration within vapor dryer chamber (12). A controller (40) is associated with the vapor monitor assembly (30) and evaluates vapor concentration measurements from the vapor monitor (38).
    Type: Application
    Filed: November 1, 2002
    Publication date: March 27, 2003
    Inventors: Neal T. Murphy, Claire Ching-Shan Jung, Daryl R. Koehl, Donald J. Rigsby
  • System and method for controlling a vapor dryer process
    Patent number: 6497055
    Abstract: A system and method are disclosed including a vapor dryer chamber (12) with a lid (14). A heater (16) is disposed within the vapor dryer chamber to vaporize liquid drying medium (24), preferably isopropyl alcohol, in the bottom of the vapor dryer chamber (12). Cooling coils (18) disposed within an upper portion of the vapor drying chamber (12) condense the drying medium vapor. A vapor monitor assembly (30) is disposed within the vapor dryer chamber (12) to monitor the vapor concentration within vapor dryer chamber (12). A controller (40) is associated with the vapor monitor assembly (30) and evaluates vapor concentration measurements from the vapor monitor (38).
    Type: Grant
    Filed: December 14, 2000
    Date of Patent: December 24, 2002
    Assignee: Texas Instruments Incorporated
    Inventors: Neal T. Murphy, Claire Ching-Shan Jung, Daryl R. Koehl, Donald J. Rigsby
  • System and method for controlling a vapor dryer process
    Publication number: 20010029683
    Abstract: A system and method are disclosed including a vapor dryer chamber (12) with a lid (14). A heater (16) is disposed within the vapor dryer chamber to vaporize liquid drying medium (24), preferably isopropyl alcohol, in the bottom of the vapor dryer chamber (12). Cooling coils (18) disposed within an upper portion of the vapor drying chamber (12) condense the drying medium vapor. A vapor monitor assembly (30) is disposed within the vapor dryer chamber (12) to monitor the vapor concentration within vapor dryer chamber (12). A controller (40) is associated with the vapor monitor assembly (30) and evaluates vapor concentration measurements from the vapor monitor (38).
    Type: Application
    Filed: December 14, 2000
    Publication date: October 18, 2001
    Inventors: Neal T. Murphy, Claire Ching-Shan Jung, Daryl R. Koehl, Donald J. Rigsby