Patents by Inventor Donald J. Ronning

Donald J. Ronning has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for detecting and reporting fabrication defects using a multi-variant image analysis
    Patent number: 7463765
    Abstract: An inspection process and an inspection system (600) that utilize a plurality of residual defect signals 252(1), 252(2), . . . 252(n) to identify and report defects of interest in a copy (116) of a standard (112). The process includes performing a multi-variant defect extraction method (200) that includes applying a number n of pre-determined transforms to both a data file (232) containing the standard and an image file (204) containing the copy of the standard so as to create a plurality of conditioned data files (244(1), 244(2), . . . 244(n)) and a plurality of conditioned image files (216(1), 216(2), . . . 216(n)). The plurality of residual defect signals are extracted from these conditioned files. A defect analysis and reporting method (500) utilizes the residual defect signals to report defects contained in two or more of the residual defect signals.
    Type: Grant
    Filed: February 24, 2004
    Date of Patent: December 9, 2008
    Assignee: Lamda-Lite Enterprises Incorporated
    Inventors: Vincent J. Messina, Donald J. Ronning
  • System and method for detecting and reporting fabrication defects using a multi-variant image analysis
    Publication number: 20040165762
    Abstract: An inspection process and an inspection system (600) that utilize a plurality of residual defect signals 252(1), 252(2), . . . 252(n) to identify and report defects of interest in a copy (116) of a standard (112). The process includes performing a multi-variant defect extraction method (200) that includes applying a number n of pre-determined transforms to both a data file (232) containing the standard and an image file (204) containing the copy of the standard so as to create a plurality of conditioned data files (244(1), 244(2), . . . 244(n)) and a plurality of conditioned image files (216(1), 216(2), . . . 216(n)). The plurality of residual defect signals are extracted from these conditioned files. A defect analysis and reporting method (500) utilizes the residual defect signals to report defects contained in two or more of the residual defect signals.
    Type: Application
    Filed: February 24, 2004
    Publication date: August 26, 2004
    Applicant: Lamda-Lite Enterprises, Inc.
    Inventors: Vincent J. Messina, Donald J. Ronning