Abstract: An automatic faucet system includes a sensor and a controller. The sensor includes an emitter constructed and arranged to emit light having a first polarization toward an object. The sensor further includes a detector configured to detect light reflected from the object having a second polarization that is different from the first polarization. The controller is operatively coupled to the detector. The controller is configured to supply water to a faucet, or other water supply, upon sensing by the detector the light having the second polarization. By sensing in such a manner, the level of false positive readings in the system is reduced. The detector is further configured to determine the location of the object so that the faucet is only activated when the object is in close proximity to the faucet.

Abstract: A surface capacity parameter is determined for a surface of an article having irregularities therein that can be characterized by peaks and valleys relative to a reference point. Initially, an area of interest on the surface of the article and a lateral resolution of that area of interest are determined. An apparatus generates a visual representation of the area of interest on the surface of the article. A deflection contact part factor for the article is calculated, and a bearing ratio curve level is determined based upon the calculated deflection contact part factor and the magnitude of the height or distance between the tallest peak and the lowest valley on the surface of the article. The volume of the material comprising the peaks in the surface of the article and the volume of the space in the surface of the article that is available for the retention of a fluid, such as a lubricant, are determined.

Abstract: A method for measuring irregularities on the outer surface of an article employs an apparatus to obtain qualitative information regarding a first portion of the outer surface of the article, which can be used to generate a visual representation of a first portion of the outer surface of the article. Then, the article is moved by a predetermined amount, and the apparatus is again used to generate a visual representation of a second portion of the surface of the article. This process is repeated to obtain a plurality of visual representations that together span across a predetermined amount of the surface of the article. Then, the plurality of visual representations are processed to generate a single comprehensive enlarged visual representation of a relatively large surface area of the article, which is preferably shaded, colored, or otherwise highlighted to illustrate the irregularities that are formed therein.

Abstract: A nondestructive method and apparatus for the inspection of impact treated surfaces to predict impact treatment process variables which acquires a multi-dimensional map of an impact treated surface, characterizes the multi-dimensional map to develop surface texture parameters, and develops relationships between the surface texture parameters and the impact treatment process variables.

Abstract: A method for storing elastic bands makes use of an annular storage device, larger in diameter than the unstretched length of the elastic bands to be stored. The device has a series of clogs around its circumference, thereby creating a recessed area between each pair of adjacent clogs. The elastic bands to be stored are sequentially applied to the device, each elastic band being stretched between diametrically opposed recesses, thereby spanning the center. The elastic bands are then later removed in reverse order, as needed.

Abstract: A method of profiling a rough surface of an object includes moving the object along a z axis so that a highest point of the rough surface is optically aligned with and outside of the focus range of a solid-state imaging array. An interferogram of the rough surface then is produced by means of a two beam interferometer. The solid-state imaging array is operated to scan the rough surface along x and y axes to produce intensity data for each pixel of the solid-state imaging array for a plurality of frames each shifted from the other by a preselected phase difference. The modulation for each pixel is computed from the intensity data. The most recently computed modulation of each pixel is compared with a stored prior value of modulation of that pixel. The prior value is replaced with the most recently computed value if the most recently computed value is greater.

Abstract: A method of profiling a rough surface of an object includes moving the object along a z axis so that a highest point of the rough surface is optically aligned with and outside of the focus range of a solid-state imaging array. An interferogram of the rough surface then is produced by means of a two beam interferometer. The solid-state imaging array is operated to scan the rough surface along x and y axes to produce intensity data for each pixel of the solid-state imaging array for a plurality of frames each shifted from the other by a preselected phase difference. The modulation for each pixel is computed from the intensity data. The most recently computed modulation of each pixel is compared with a stored prior value of modulation of that pixel. The prior value is replaced with the most recently computed value if the most recently computed value is greater.

Abstract: A method of profiling a rough surface of an object includes moving the object along a z axis so that a highest point of the rough surface is optically aligned with and outside of the focus range of a solid-state imaging array. An interferogram of the rough surface then is produced by means of a two beam interferometer. The solid-state imaging array is operated to scan the rough surface along x and y axes to produce intensity data for each pixel of the solid-state imaging array for a plurality of frames each shifted from the other by a preselected phase difference. The modulation for each pixel is computed from the intensity data. The most recently computed modulation of each pixel is compared with a stored prior value of modulation of that pixel. The prior value is replaced with the most recently computed value if the most recently computed value is greater.

Abstract: The relative height variation and the thickness of a film of an object are simultaneously measured. A first interference pattern is produced for a calibration surface at a first wavelength and detected. Intensities of the first interference pattern are measured and used to compute a first group of phase values for each pixel. Intensity values of a point of the calibration samples are measured and used to compute a corresponding phase. A second interference pattern for the calibration surface is produced at a second wavelength and detected. Intensities of the second interference pattern are measured and used to compute a second group of phase values for each pixel. Intensity values of the point of the calibration surface are measured and used to compute a corresponding phase. A value for the surface height change .DELTA.h is computed by obtaining a linear combination of the corresponding phase values of the data groups.

Abstract: Automatic focusing of an interference microscope is accomplished by directly sensing an interference pattern produced by a white light source with an auxiliary point detector. A beamsplitter intercepts part of the interference beam and directs it to the point detector. A narrow band filter filters light passing through the beam splitter on its way to a main detector array. An objective of the interference microscope is rapidly moved to an initial position between a sample surface and a fringe window by operating a position sensor to sense when the objective is a predetermined safe distance from the sample surface and turning off a motor moving the objective. The objective then moves rapidly from the initial position until the presence of fringes is detected by the point detector. Momentum of the microscope causes the objective to overshoot beyond a fringe window.

Abstract: Automatic focusing of an interference microscope is accomplished by directly sensing an interference pattern produced by a white light source with an auxiliary point detector. A beamsplitter intercepts part of the interference beam and directs it to the point detector. A narrow band filter filters light passing through the beam splitter on its way to a main detector array. A memory lock position of the microscope objective is manually selected and stored. Initially, the objective moves rapidly from the memory lock position until the presence of fringes is detected by the point detector. Momentum of the microscope causes the objective to overshoot beyond a fringe window. The microscope objective then is moved more slowly through the interference window until fringes again are detected; the lower speed results in substantially reduced overshoot. Intensity measurements from the point detector are sensed and stored as the objective moves through the width of the fringe window.

Abstract: An optical head for an optical signal recorder includes a nonpolarizing beam combiner for combining the light beams from two like-frequency, sic wavelength, lasers along one light path. The combined beams travel slightly diverging paths so that a first one of the beams can record signals on a disk while a second beam follows the first beam on the disk for direct reading-after-recording. Intermediate the combiner and the disk are a polarization type beam splitter and a focuser. One or more detectors receive reflected light from the disk via the beam splitter for detecting focus, sensed recorded signals and for tracking the beams to tracks of the disk. The combiner and splitter are preferably secured together as a single unit. The combiner uses refraction and internal reflection properties to combine the two like-frequency beams without polarization changes of either beam.

Abstract: An optical disk recorder focus-error system includes a so-called "knife-edge" focus detector. The dynamic range of the detector is enlarged by placing an apertured mask intermediate the knife edge and the source of the light beam being focused. The knife-edge mask and the apertured mask can be deposited opaque films on a lens.

Abstract: An optical system, preferably used in an optical data recorder, has a laser light source emitting a light beam having an ovate or elliptical cross-section. An astigmatic optical element, such as a hemicylinder or cylindrical lens, disposed at 45 degrees with respect to the major axis, also termed the beam ellipse axis, in front of a focus detector eliminates focus offset errors caused by beam ellipticity.

Abstract: In an optical data storage disk device, focus of the recording and sensing beam is detected by sensing lateral shear (rotational orientation of a light interference pattern) of a beam reflected from the optical data storage disk. An exemplary shear detector includes a quadrant sensor having four quadrants for sensing the rotation of the reflected beam's interference pattern. Electrical analysis circuits illustrate evaluation of the sensed rotated interference pattern.

Abstract: An optical device, such as an optical digital data recorder, includes a variable optical wedge in the light path. The variable wedge facilitates assembly by a two-step adjustment process; the first step aligns a light receptor portion to receive an input light beam at an angle so as to remove ellipticity from the input beam while the second subsequent step adjusts the wedge assembly to align a transmit and reflected light path for optically coupling the wedge to a record medium. The receptor portion includes a semicircular cross-sectioned lens movable disposed in a mating cavity for adjusting the angle of reception independently of the reflected wave position.