Abstract: Various computing systems and methods of using the same are disclosed. In one aspect, a computing system is provided that includes a semiconductor chip that is operable to execute start up self test code. An encoder is operable to encode the progress of the execution of the start up self test code to generate encoded debug code. Also included is means for wirelessly outputting the encoded debug code from the computing system.

Abstract: Systems, apparatuses, and methods for monitoring power rails during power sequences are disclosed. An apparatus includes one or more voltage regulators, a plurality of registers, and control logic. The control logic is configured to monitor a power rail generated by a voltage regulator. The control logic generates and stores an indication of pass or failure in a first register for the power rail during a power sequence. The control logic enables the first register to be read by an external device subsequent to completion of the power sequence. In another embodiment, the control logic generates a pass indicator if the power rail is less than a first voltage value on a first boundary of a timing interval and if the power rail is greater than a second voltage value on a second boundary of the timing interval. Otherwise, a fail indicator is generated.

Abstract: Systems, apparatuses, and methods for monitoring power rails during power sequences are disclosed. An apparatus includes one or more voltage regulators, a plurality of registers, and control logic. The control logic is configured to monitor a power rail generated by a voltage regulator. The control logic generates and stores an indication of pass or failure in a first register for the power rail during a power sequence. The control logic enables the first register to be read by an external device subsequent to completion of the power sequence. In another embodiment, the control logic generates a pass indicator if the power rail is less than a first voltage value on a first boundary of a timing interval and if the power rail is greater than a second voltage value on a second boundary of the timing interval. Otherwise, a fail indicator is generated.

Abstract: Various computing systems and methods of using the same are disclosed. In one aspect, a computing system is provided that includes a semiconductor chip that is operable to execute start up self test code. An encoder is operable to encode the progress of the execution of the start up self test code to generate encoded debug code. Also included is means for wirelessly outputting the encoded debug code from the computing system.