Abstract: An integrated complementary transistor circuit at an intermediate stage of manufacturing comprises a semiconductor substrate having dopant atoms of a first conductivity type and having a substantially flat major surface; a patterned layer of material that is essentially impervious to oxygen diffusion covering first and second spaced apart areas on the surface and having openings which expose the surface between the areas; a channel stop region having dopant atoms of the first conductivity type with a larger doping concentration than the substrate throughout that portion of the surface which is exposed by the openings; and a well region having dopant atoms of a second conductivity type opposite to the first type in the substrate under all of the second area and extending under an adjacent portion of the channel stop region but terminating before reaching the first area; the well region also having a depth and doping concentration at the center of the second area which is substantially smaller than the depth an

Abstract: The disclosed memory cell is comprised of a charge storage region and an adjacent charge transfer channel. A deep dopant layer extends throughout the charge storage region, and a shallow dopant layer extends throughout the charge storage region plus part-way through the charge transfer channel. Overlying the charge storage region is a first conductor that is completely covered by a thick insulating layer. This thick insulating layer also extends into the charge transfer channel part-way over the shallow dopant layer. A thin insulating layer covers the remaining portion of the channel. Lying on this thin insulating layer and extending onto the thick insulating layer is a second conductor.

Abstract: The disclosed memory cell is comprised of a charge storage region and an adjacent charge transfer channel. A deep dopant layer extends throughout the charge storage region, and a shallow dopant layer extends throughout the charge storage region plus part-way through the charge transfer channel. Overlying the charge storage region is a first conductor that is completely covered by a thick insulating layer. This thick insulating layer also extends into the charge transfer channel part-way over the shallow dopant layer. A thin insulating layer covers the remaining portion of the channel. Lying on this thin insulating layer and extending onto the thick insulating layer is a second conductor.

Abstract: Disclosed is a RAM that includes a semiconductor substrate having P-type dopant impurity atoms and having a major surface. A plurality of spaced apart regions of N-type atoms lie within a predetermined area on the surface to define storage regions for the cells of the memory. An insulating layer of substantially uniform thickness with a conductive layer lying thereon completely covers the predetermined area except for a plurality of elongated openings which extend outward from each of the storage regions. A layer of P-type dopant atoms lie at substantially the same level as the storage regions throughout that portion of the substrate that is beneath the insulating layer. By this structure, the perimeter of a transfer gate that exhibits essentially no narrow channel width effect is defined from each storage region by the respective openings.

Abstract: A method of fabricating an integrated circuit having a plurality of different devices, which method employs a single mask to define the active areas of all such devices. A silicon oxide-silicon nitride layer is formed on the surface of a silicon wafer so as to define the location of subsequent oxide insulating layers which in turn actually define all the active areas of the circuit. Respective active areas for the different devices can then be formed by selective ion implantation.

Abstract: An IGFET integrated circuit memory cell structure utilizing a capacitor with increased charge storage capability, and a method making the same. The capacitor includes a high impurity concentration region having the same conductivity type as the substrate. An island of opposite conductivity type is inset in the region and a conductive field plate overlies the island. The structure also includes a transfer transistor in which the source region is adjacent the capacitor and overlaps the island region therein. Activation of the transistor serves to transfer the charge stored in the capacitor to the drain region where it can be read by external circuitry. In the method, the high concentration region and island in the capacitor are formed by successive ion implantation steps.

Abstract: An IGFET integrated circuit memory cell structure utilizing a capacitor with increased charge storage capability, and a method making the same. The capacitor includes a high impurity concentration region having the same conductivity type as the substrate. An island of opposite conductivity type is inset in the region and a conductive field plate overlies the island. The structure also includes a transfer transistor in which the source region is adjacent the capacitor and overlaps the island region therein. Activation of the transistor serves to transfer the charge stored in the capacitor to the drain region where it can be read by external circuitry. In the method, the high concentration region and island in the capacitor are formed by successive ion implantation steps.

Abstract: An MOS integrated circuit chip for both addressing and driving display devices in display panels. The chip includes low-level logic devices for receiving and manipulating data for energizing a selected number of devices in the display panel. An output driver portion is coupled to the display devices and energizes the devices in response to the data received by the input logic. The output driver portion includes a transistor in which the drain region extends deeper into the substrate than the source region of the transistor, as well as the remainder of the active regions in the integrated circuit chip. Accordingly, the integrated circuit chip can withstand a high breakdown voltage at its driver output, while also providing high density logic devices thereby minimizing discrete components and their associated separate electrical interconnections.