Patents by Inventor Donald M. Metzger

Donald M. Metzger has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • S-parameter measurement system for wideband non-linear networks
    Patent number: 6594604
    Abstract: A system for determining scattering parameters (S-parameters) characterizing the behavior of a network applies a wideband stimulus signal containing multiple signal components as input to the network. The system then measures incident and reflected waveforms at all of the network's ports, digitizes and converts the measured waveforms from time domain to frequency domain data, and then computes the S-parameters values for each frequency component of interest from the frequency domain data for that frequency. The system also determines its own error coefficients (E-coefficients) for each frequency of interest from data collected during a sequence of measurements in response to either a sinusoid or a wideband signal and adjusts the computed S-parameter values accordingly.
    Type: Grant
    Filed: February 14, 2001
    Date of Patent: July 15, 2003
    Assignee: Credence Systems Corporation
    Inventors: Donald M. Metzger, David B. Marshall, Curtis C. Hainds
  • S-parameter measurement system for wideband non-linear networks
    Publication number: 20010004729
    Abstract: A system for determining scattering parameters (S-parameters) characterizing the behavior of a network applies a wideband stimulus signal containing multiple signal components as input to the network. The system then measures incident and reflected waveforms at all of the network's ports, digitizes and converts the measured waveforms from time domain to frequency domain data, and then computes the S-parameters values for each frequency component of interest from the frequency domain data for that frequency. The system also determines its own error coefficients (E-coefficients) for each frequency of interest from data collected during a sequence of measurements in response to either a sinusoid or a wideband signal and adjusts the computed S-parameter values accordingly.
    Type: Application
    Filed: February 14, 2001
    Publication date: June 21, 2001
    Inventors: Donald M. Metzger, David B. Marshall, Curtis C. Hainds