Patents by Inventor Donald P. Richmond, II
Donald P. Richmond, II has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240103068Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: ApplicationFiled: November 29, 2023Publication date: March 28, 2024Applicant: AEHR TEST SYSTEMSInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Patent number: 11860221Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: GrantFiled: January 12, 2022Date of Patent: January 2, 2024Assignee: AEHR TEST SYSTEMSInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Publication number: 20220373595Abstract: A cartridge, including a cartridge frame, formations on the cartridge frame for mounting the cartridge frame in a fixed position to an apparatus frame, a contactor support structure, a contactor interface on the contactor support structure, a plurality of terminals, held by the contactor support structure, for contacting contacts on a device, and a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals.Type: ApplicationFiled: July 18, 2022Publication date: November 24, 2022Applicant: AEHR TEST SYSTEMSInventors: Scott E. Lindsey, Jovan Jovanovic, David S. Hendrickson, Donald P. Richmond, II
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Patent number: 11448695Abstract: A cartridge, including a cartridge frame, formations on the cartridge frame for mounting the cartridge frame in a fixed position to an apparatus frame, a contactor support structure, a contactor interface on the contactor support structure, a plurality of terminals, held by the contactor support structure, for contacting contacts on a device, and a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals.Type: GrantFiled: April 23, 2020Date of Patent: September 20, 2022Assignee: Aehr Test SystemsInventors: Scott E. Lindsey, Jovan Jovanovic, David S. Hendrickson, Donald P. Richmond, II
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Publication number: 20220137121Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: ApplicationFiled: January 12, 2022Publication date: May 5, 2022Applicant: AEHR TEST SYSTEMSInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Patent number: 11255903Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: GrantFiled: September 29, 2020Date of Patent: February 22, 2022Assignee: Aehr Test SystemsInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Patent number: 10976362Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: GrantFiled: June 11, 2020Date of Patent: April 13, 2021Assignee: AEHR TEST SYSTEMSInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
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Publication number: 20210025935Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: ApplicationFiled: September 29, 2020Publication date: January 28, 2021Applicant: Aehr Test SystemsInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Patent number: 10852347Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: GrantFiled: September 4, 2018Date of Patent: December 1, 2020Assignee: AEHR TEST SYSTEMSInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Publication number: 20200300908Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: ApplicationFiled: June 11, 2020Publication date: September 24, 2020Applicant: AEHR TEST SYSTEMSInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
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Publication number: 20200256917Abstract: A cartridge, including a cartridge frame, formations on the cartridge frame for mounting the cartridge frame in a fixed position to an apparatus frame, a contactor support structure, a contactor interface on the contactor support structure, a plurality of terminals, held by the contactor support structure, for contacting contacts on a device, and a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals.Type: ApplicationFiled: April 23, 2020Publication date: August 13, 2020Applicant: Aehr Test SystemsInventors: Scott E. Lindsey, Jovan Jovanovic, David S. Hendrickson, Donald P. Richmond, II
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Patent number: 10718808Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: GrantFiled: October 26, 2018Date of Patent: July 21, 2020Assignee: AEHR TEST SYSTEMSInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
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Patent number: 10677843Abstract: A cartridge, including a cartridge frame, formations on the cartridge frame for mounting the cartridge frame in a fixed position to an apparatus frame, a contactor support structure, a contactor interface on the contactor support structure, a plurality of terminals, held by the contactor support structure, for contacting contacts on a device, and a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals.Type: GrantFiled: December 17, 2015Date of Patent: June 9, 2020Assignee: AEHR TEST SYSTEMSInventors: Scott E. Lindsey, Jovan Jovanovic, David S. Hendrickson, Donald P. Richmond, II
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Patent number: 10488437Abstract: A tester is described having output circuits that are operable in either power mode or driver mode. A switching circuit connects force and sense lines to one of the output circuits when in power mode, or connects the same lines separately to the output circuits when in driver mode. A further configuration allows for power to be provided through the lines separately while detecting a measure of power through each line and correcting for unknown resistances of leads connected to the lines.Type: GrantFiled: December 18, 2017Date of Patent: November 26, 2019Assignee: AEHR TEST SYSTEMSInventors: Donald P. Richmond, II, David S. Hendrickson
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Publication number: 20190072607Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: ApplicationFiled: October 26, 2018Publication date: March 7, 2019Applicant: AEHR TEST SYSTEMSInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
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Publication number: 20180372792Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: ApplicationFiled: September 4, 2018Publication date: December 27, 2018Applicant: Aehr Test SystemsInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Patent number: 10151793Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: GrantFiled: November 27, 2017Date of Patent: December 11, 2018Assignee: AEHR TEST SYSTEMSInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
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Patent number: 10094872Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: GrantFiled: March 3, 2016Date of Patent: October 9, 2018Assignee: AEHR TEST SYSTEMSInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Publication number: 20180106837Abstract: A tester is described having output circuits that are operable in either power mode or driver mode. A switching circuit connects force and sense lines to one of the output circuits when in power mode, or connects the same lines separately to the output circuits when in driver mode. A further configuration allows for power to be provided through the lines separately while detecting a measure of power through each line and correcting for unknown resistances of leads connected to the lines.Type: ApplicationFiled: December 18, 2017Publication date: April 19, 2018Applicant: Aehr Test SystemsInventors: Donald P. Richmond, II, David S. Hendrickson
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Publication number: 20180080981Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: ApplicationFiled: November 27, 2017Publication date: March 22, 2018Applicant: AEHR TEST SYSTEMSInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon