Patents by Inventor Donald W. Chiu

Donald W. Chiu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • TEST ELECTRONICS TO DEVICE UNDER TEST INTERFACES, AND METHODS AND APPARATUS USING SAME
    Publication number: 20130135002
    Abstract: In one embodiment, an interface includes a plurality of test electronics to DUT interfaces. Each test electronics to DUT interface has at least one test electronics interface, at least one DUT interface, and an electrical coupling between the at least one test electronics interface and the at least one DUT interface. First and second subsets of the DUT interfaces are respectively positioned along the perimeters of first and second concentric shapes.
    Type: Application
    Filed: January 15, 2013
    Publication date: May 30, 2013
    Applicant: ADVANTEST (SINGAPORE) PTE LTD
    Inventors: Sanjeev Grover, Donald W. Chiu, John W. Andberg
  • Test electronics to device under test interfaces, and methods and apparatus using same
    Patent number: 8354853
    Abstract: In one embodiment, a test system has a set of test electronics for testing a device under test (DUT). The test system also has at least one test electronics to DUT interface having a zero insertion force (ZIF) connector. Each ZIF connector has a ZIF connector to DUT clamping mechanism configured to i) apply a first orthogonal force to a probe card that interfaces with a DUT, by pressing the ZIF connector against the probe card, and simultaneously ii) exert at least one second orthogonal force on the probe card, the at least one second orthogonal force being opposite in direction to the first orthogonal force.
    Type: Grant
    Filed: November 25, 2009
    Date of Patent: January 15, 2013
    Assignee: Advantest (Singapore) Pte Ltd
    Inventors: Sanjeev Grover, Donald W. Chiu, John W. Andberg
  • TEST ELECTRONICS TO DEVICE UNDER TEST INTERFACES, AND METHODS AND APPARATUS USING SAME
    Publication number: 20100134134
    Abstract: In one embodiment, a test system has a set of test electronics for testing a device under test (DUT). The test system also has at least one test electronics to DUT interface having a zero insertion force (ZIF) connector. Each ZIF connector has a ZIF connector to DUT clamping mechanism configured to i) apply a first orthogonal force to a probe card that interfaces with a DUT, by pressing the ZIF connector against the probe card, and simultaneously ii) exert at least one second orthogonal force on the probe card, the at least one second orthogonal force being opposite in direction to the first orthogonal force.
    Type: Application
    Filed: November 25, 2009
    Publication date: June 3, 2010
    Inventors: Sanjeev Grover, Donald W. Chiu, John W. Andberg
  • Trailer hitch box beam cover with integral trailer wiring connector
    Patent number: 5593170
    Abstract: An cover for protecting a trailer hitch ball or box beam comprises a resilient body having a wiring connector integrally formed therewith. Moisture, dirt and physical damage of the trailer hitch ball is minimized through use of the protective cover.
    Type: Grant
    Filed: February 28, 1995
    Date of Patent: January 14, 1997
    Inventor: Donald W. Chiu
  • Trailer hitch ball cover with integral trailer wiring connector
    Patent number: 5407219
    Abstract: An cover for protecting a trailer hitch ball or box beam comprises a resilient body having a wiring connector and wiring cable integrally formed therewith. Moisture, dirt and physical damage of the trailer hitch ball is minimized through use of the protective cover.
    Type: Grant
    Filed: July 8, 1993
    Date of Patent: April 18, 1995
    Inventor: Donald W. Chiu