Abstract: A method is provided for de-embedding the S-parameter response of an electrical DUT embedded in an electrical network. The method comprises making first and second S-parameter measurements in the frequency domain at a port or measurement reference plane to the network containing the DUT. For the second measurement, a known impedance condition is created at the embedded location of the DUT. The first and second measurements are transformed to the time domain, and then gated to select portions of the time-domain-transformed responses that correspond to paths that include the DUT and known impedance condition, respectively. The gated time domain responses are then transformed back into the frequency domain, yielding first and second selected S-parameter measurement responses M1 and M2, respectively. A reflection S-parameter for the DUT is then determined as a function of the first and second selected S-parameter measurement responses and the known impedance condition.

Abstract: A method is provided for de-embedding the S-parameter response of an electrical DUT embedded in an electrical network. The method comprises making first and second sets of S-parameter measurements in the frequency domain at a port or measurement reference plane to the network containing the DUT. For the second measurement, a known impedance condition is created at the embedded location of the DUT. The first and second sets of measurements are transformed to the time domain, and then gated to select portions of the time-domain-transformed responses that correspond to paths that include the DUT and known impedance condition, respectively. The gated time domain responses are then transformed back into the frequency domain, yielding first and second sets of selected S-parameter measurement responses. Reflection S-parameters for the DUT are then determined as a function of the first and second sets of selected S-parameter measurement responses and the known impedance condition.