Abstract: An interferometer for Fourier transform infrared spectroscopy includes a fixed assembly including a housing, a beam splitter, and a mirror fixedly positioned relative to each other. A movable assembly includes a housing, a mirror, and a motor coil, fixedly positioned relative to each other. A first flat spring has an opening for providing an unobstructed optical path of radiation therethrough. A first end of the first flat spring is secured to the fixed assembly and a second end of the first flat spring is secured to the movable assembly for providing movement of the movable assembly relative to the fixed assembly via the first flat spring. An optical relationship between the beam splitter, the mirror of the fixed assembly, and the mirror of the movable assembly is maintained independent of a distance between the movable assembly and the fixed assembly.

Abstract: An optical analysis system utilizing transmission spectroscopy for analyzing liquids and solids includes a source of optical energy, a sample, a movable optical energy transmission window, a fixed optical energy transmission window, and a detection system. The fixed transmission window remains fixed relative to the source of optical energy. The sample is selectively positioned between the movable and fixed optical energy transmission windows for analyzing the sample. The optical energy is transmitted through one of the windows, the sample, and the other window to obtain encoded optical energy as a result of transmitting the optical energy through the sample. A detection system receives the encoded optical energy for analysis. The movable optical energy transmission window is selectively movable relative to the fixed optical energy transmission window to repeatedly and precisely align and make readily accessible both windows and the sample.

Abstract: An interferometer for Fourier transform infrared spectroscopy includes a fixed assembly including a housing, a beam splitter, and a mirror fixedly positioned relative to each other. A movable assembly includes a housing, a mirror, and a motor coil, fixedly positioned relative to each other. A first flat spring has an opening for providing an unobstructed optical path of radiation therethrough. A first end of the first flat spring is secured to the fixed assembly and a second end of the first flat spring is secured to the movable assembly for providing movement of the movable assembly relative to the fixed assembly via the first flat spring. An optical relationship between the beam splitter, the mirror of the fixed assembly, and the mirror of the movable assembly is maintained independent of a distance between the movable assembly and the fixed assembly.

Abstract: An optical analysis system utilizing transmission spectroscopy for analyzing liquids and solids includes a source of optical energy, a sample, a movable optical energy transmission window, a fixed optical energy transmission window, and a detection system. The fixed transmission window remains fixed relative to the source of optical energy. The sample is selectively positioned between the movable and fixed optical energy transmission windows for analyzing the sample. The optical energy is transmitted through one of the windows, the sample, and the other window to obtain encoded optical energy as a result of transmitting the optical energy through the sample. A detection system receives the encoded optical energy for analysis. The movable optical energy transmission window is selectively movable relative to the fixed optical energy transmission window to repeatedly and precisely align and make readily accessible both windows and the sample.

Abstract: A mid-IR spectrometer attachment performs reflection spectroscopy measurements using commercially available infinity corrected light microscopes without degrading the microscope's performance. The mid-IR spectrometer attachment, which is mounted to and supported by the visible light microscope, introduces infrared radiation into the optical path of the microscope. Radiation from the mid-IR spectrometer source is directed by a trichroic radiation director to a mid-IR objective lens affixed to the microscope nosepiece. The objective lens focuses the radiation on to a subject sample surface in order to acquire either internally or externally reflected infrared spectra by subsequently directing the sample encoded reflected mid-infrared radiation to the radiation director and then to a mid-infrared radiation detection system.

Abstract: An opto-electronic image magnifying system. The magnifiying system includes: a light source (38, 39) which illuminates an object to be viewed; a miniaturized opto-electronic magnifier module (MOM), made of a lens (31) and a photodetector array (32), which receives the light from the illuminated object; an electronic circuit (34) which receives the signal from the MOM; a video-monitor (35) which receives the magnified signal from the electronic circuit and displays the image. The opto-electronic image magnifying system allows for small objects or features of small objects to be observed in which historically compound microscopes or specialized optical viewing systems were required to observe the small objects.

Abstract: A mid-infrared (mid-IR) spectrometer attachment performs reflection spectroscopy measurements using commercially available infinity corrected light microscopes. The mid-IR spectrometer attachment introduces infrared radiation into the optical path of a visible light microscope. Radiation from the mid-IR spectrometer source is directed by a radiation director to a mid-IR objective lens affixed to the microscope nosepiece. The objective lens focuses the radiation on to a subject sample surface in order to acquire either internally or externally reflected infrared spectra by subsequently directing the sample encoded reflected infrared radiation to an infrared radiation detection system. The mid-IR spectrometer attachment is mechanically and optically compatible with a plurality of commercial infinity-corrected visible light microscopes.

Abstract: A mid-IR spectrometer attachment performs reflection spectroscopy measurements using commercially available infinity corrected light microscopes without degrading the microscope's performance. The mid-IR spectrometer attachment, which is mounted to and supported by the visible light microscope, introduces infrared radiation into the optical path of the microscope. Radiation from the mid-IR spectrometer source is directed by a trichroic radiation director to a mid-IR objective lens affixed to the microscope nosepiece. The objective lens focuses the radiation on to a subject sample surface in order to acquire either internally or externally reflected infrared spectra by subsequently directing the sample encoded reflected mid-infrared radiation to the radiation director and then to a mid-infrared radiation detection system.

Abstract: A mid-infrared (mid-IR) spectrometer attachment performs reflection spectroscopy measurements using commercially available infinity corrected light microscopes. The mid-IR spectrometer attachment introduces infrared radiation into the optical path of a visible light microscope. Radiation from the mid-IR spectrometer source is directed by a radiation director to a mid-IR objective lens affixed to the microscope nosepiece. The objective lens focuses the radiation on to a subject sample surface in order to acquire either internally or externally reflected infrared spectra by subsequently directing the sample encoded reflected infrared radiation to an infrared radiation detection system. The mid-IR spectrometer attachment is mechanically and optically compatible with a plurality of commercial infinity-corrected visible light microscopes.

Abstract: A crystal assembly for optical analyzation of samples includes a first crystal member and a second crystal member, the latter of which is preferably a diamond. The first and second crystal members, which have substantially the same index of refraction for infrared energy, are coupled together at an optically transmitting interface. This interface may be formed by crystal surfaces in intimate contact with one another or by a third crystal member positioned therebetween. The first crystal member has at least one circumferential sidewall focusing surface for redirecting infrared energy within the first crystal member to and from a focal ring or focal plane at or near the optical interface. The focused infrared energy transmitted from the first crystal member is internally reflected within the second crystal member to obtain encoding specific to a sample in contact with a surface of the second crystal member.

Abstract: An apparatus and method for spectroscopic or radiometric analysis of solid, liquid, or gas samples includes first and second optically transmitting materials. The first optically transmitting material has selected bulk optical transmission and index of refraction properties which enable infrared radiation transmission therethrough across selected optical transmission ranges. The first optically transmitting material is of a type which normally has chemical or mechanical degradation when in contact with the sample during spectroscopic or radiometric analysis. The second optically transmitting material is preferably a wafer or thin sheet in optical/mechanical contact with the first optically transmitting material. The second material is designed to be located between the first optically transmitting material and the sample all held in a fixture or fixtures to prevent the sample from contacting the first material during spectroscopic or radiometric analysis of the sample.

Abstract: A crystal assembly for optical analyzation of samples includes a first crystal member and a second crystal member, the latter of which is preferably a diamond. The first and second crystal members, which have substantially the same index of refraction for infrared energy, are coupled together at an optically transmitting interface. This interface may be formed by crystal surfaces in intimate contact with one another or by a third crystal member positioned therebetween. The first crystal member has at least one circumferential sidewall focusing surface for redirecting infrared energy within the first crystal member to and from a focal ring or focal plane at or near the optical interface. The focused infrared energy transmitted from the first crystal member is internally reflected within the second crystal member to obtain encoding specific to a sample in contact with a surface of the second crystal member.

Abstract: A radiant energy spectroscopy system includes a diamond as a single bounce internal reflection element (IRE). A standard anvil cut diamond can be used as the IRE. Alternatively, a diamond can be specially cut to have a conical, spherical or curved section in the crown and/or in the pavilion and a curved or flat surface portion for the culet and/or table.

Abstract: An internal reflectance element (IRE), used for internal reflectance spectroscopy (IRS) of solid or liquid samples, has a body including a very small contacting surface adapted to insure contact with a small portion of the sample to improve the spectroscopic analysis of that sample. The contacting surface of the IRE for solids preferably is 100 microns or smaller in diameter and preferably is convexly curved. The contacting surface of the IRE for liquids preferably is 500 microns or smaller. The IRE of the present invention is most frequently used in single internal reflection applications for IRS analysis of solids.

Abstract: An optical system, apparatus and method includes a visible energy source and a radiant energy source, means to direct visible or radiant energy at preselected but variable angles of incidence through an ATR crystal to a sample at a sample plane and means to collect encoded radiant energy reflected or emitted from the sample through the ATR crystal to a detector at preselected but variable angles of reflection or emission. The optical system, apparatus and method may further include a lens or other optical element selectively positioned in the optical path to change the focus of the optical path to initially survey the sample on a movable stage at a focal plane spaced from the sample plane. The survey mode permits easy identification of a surface area of interest on the sample to permit that area of interest to be moved into contact with a surface of the ATR crystal at the sample plane for subsequent accurate analysis thereof.

Abstract: An optical system, apparatus and method for analyzing samples includes a radiant energy source, a first mask, a first mirror system, a sample plane, a second mirror system, a second mask and a detector. The first and second masks are respectively positioned along the optical path of the system in the same or different Fourier planes and/or conjugate planes thereof. The first mask has at least one inlet aperture with the relative position thereof in the first mask determining the angle of the energy incidence onto the sample. The second mask has at least one outlet aperture therein passing radiant energy therethrough which has been reflected from or transmitted through the sample at a preselected angle determined by the relative position of the second aperture in the second mask.

Abstract: An optical system, apparatus and method for analyzing samples includes a radiant energy source, a first mask, a first mirror system, a sample plane, a second mirror system, a second mask and a detector. The first and second masks are respectively positioned along the optical path of the system in the same or different Fourier planes and/or conjugate planes thereof. The first mask has at least one inlet aperture with the relative position thereof in the first mask determining the angle of the energy incidence onto the sample. The second mask has at least one outlet aperture therein passing radiant energy therethrough which has been reflected from or transmitted through the sample at a preselected angle determined by the relative position of the second aperture in the second mask.

Abstract: A sampling probe for optical analyzation of a sample includes an MIR element having a cylindrical body with a flat end and a curved end. The flat end and the adjacent active portion of the body is positioned against the sample, and the curved end is operative to receive and emit radiant energy internally multiply reflected in both directions along the MIR element to optically analyze the sample. For high pressure and/or high temperature applications, the MIR element is preferably a crystal partially mounted in and sealed to a holder, which in turn is mounted in and sealed to one wall of a fluid or reaction chamber. The crystal or adjacent holder surface is coated or mirrored to enhance optical efficiency, and the crystal is secured within and sealed to the holder by soldering, an adhesive bond or a prestressed friction fit.

Abstract: An improved aperture beam splitter comprises an intercepting mirror positioned at an aperture image plane that is remote from any focus so as to deflect one half of the energy in a beam of incident radiant energy. the aperture image plane corresponds to an aperture stop and one half of an incident beam of radiant energy is lost at the aperture image plane. The remaining energy supplies the input to an optical system. The radiant energy from the output of the optical system reaches an image plane corresponding to the aperture image plane. Preferably, the optical paths of the incident and returning radiant energy are sufficiently coincident in space that the aperture image plane returns to the intercepting mirror. If the optical system forms the radiant energy into an odd number of foci, the image formed at the aperture image plane experiences a mirror symmetry reversal.

Abstract: A universal microscope for use with a commercial FT-IR spectrophotometer comprises a visible light microscope for selecting and masking an area of a sample and an infrared microscope for sampling the masked area. The visible light microscope and the infrared microscope share a common optical path between one or more remote sample image plane masks and the sample plane such that both the visible light and the infrared radiant energy are masked twice to spatially define the same area at the sample plane. The first sample image plane mask removes energy from outside the target area at the sample focus. The second sample image plane mask removes energy from outside the target area that is diffracted by the first mask or the focusing optics. The first remote sample image plane is imaged onto the second remote image plane with the radiant energy gaining spectroscopic information and additional image information by passing through or reflecting off a sample located at the intervening sample plane.