Abstract: The present disclosure provides a detection method. The detection method includes inputting an image to be detected into a detection model being pre-constructed and detecting the image to be detected. The detection model includes a defect classification identification sub-model configured to identify a classification of a defect in the image to be detected, and the defect classification identification sub-model comprises a plurality of base models and a secondary model. The present disclosure further provides an electronic device and a non-transitory computer-readable storage medium.

Abstract: The present disclosure provides a detection device of a display panel. The detection device includes: an image receiver configured to receive a detection image of a display panel to be detected; a detector configured to input the detection image of the display panel to be detected into a detection model and generate a detection result by the detection model, the detection model is pre-constructed and configured to detect the display panel. The disclosure also provides a detection method of the display panel, an electronic device and a computer readable medium.

Abstract: A distributed computing system for product defect analysis is disclosed. The distributed computing system for product defect analysis includes a computing cluster for processing product manufacturing messages, a computing cluster for identifying product defect, a product image database, and a client device.

Abstract: A data processing method, comprising: acquiring a production record corresponding to each sample of a plurality of samples, the production record including process information, a production time corresponding to the process information, and an index value; determining a high-incidence time period of defects according to index values and production times corresponding to the process information in acquired production records of a plurality of samples; determining an influence degree of the process information on sudden defect according to the high-incidence time period of defects and the acquired production records.

Abstract: A method and apparatus for measuring the actual area of a defect, and a method and apparatus for testing a display panel. The method for measuring the actual area of a defect includes: acquiring a measurement image of a display panel, wherein the measurement image has a defect region; according to the measurement image, determining the area of defect pixels of the defect in the measurement image and determining the size of reference object pixels of a reference object in the measurement image; and according to the area of the defect pixels, the size of the reference object pixels and the actual size of the reference object, determining the actual area of the defect in the display panel.

Abstract: According to the embodiments of the present disclosure, there is provided a method and device of detecting fault in production, and a computer readable storage medium. The method includes: determining whether a plurality of production paths in a production line are faultless in one or more production batches, based on production record data; and determining at least one of the plurality of production paths to be faulty, at least partially based on whether the plurality of production paths are faultless in the one or more production batches.

Abstract: A system for recommending a maximum quantity of work in process, in which one or more processors of a distributed storage device are configured to execute: acquiring at least part of production data stored in the distributed storage device, the production data includes quantity records and cycle time records of a production line in time periods, and the cycle time record of each time period includes a cycle time at each process station of the production line in said each time period; clustering the quantity records to obtain a plurality of initial classifications, each initial classification includes at least one quantity record; determining a portion of the initial classifications as preferred classifications; determining the maximum quantity of work in process at each process station; and a display device is configured to display the maximum quantity of work in process at each process station determined by an analysis device.

Abstract: A method and device for detecting a defect and method for training a model are provided. The method for detecting the defect includes: acquiring a sample data set and identifying feature information of the sample data set; acquiring an initial model; configuring a training parameter based on the feature information; obtaining a target model by training, according to the training parameter, the initial model with the sample data set; and obtaining defect information of a product by inputting real data of the product into the target model. The training parameter includes at least one of a learning rate descent strategy, a total number of training rounds and a test strategy, the learning rate descent strategy includes a number of learning rate descents and a round number when a learning rate descends, and the test strategy includes a number of tests and a round number when testing.

Abstract: A distributed computing system for product defect analysis is disclosed. The distributed computing system for product defect analysis includes a computing cluster for processing product manufacturing messages, a computing cluster for identifying product defect, a product image database, and a client device.

Abstract: A method and a device for processing product manufacturing messages, and an electronic device are disclosed. The method for processing product manufacturing messages includes: monitoring a plurality of product manufacturing messages; establishing a product defect analysis task queue based on the plurality of product manufacturing messages; distributing product defect analysis tasks to product manufacturing assisting devices based on the product defect analysis task queue, wherein the product defect analysis tasks include a task of identifying product defect content based on a defect identification model; wherein the product defect content includes any one or more of: product defect type, product defect location, and product defect size.

Abstract: A method for querying a product history is disclosed. The method includes receiving a product query request including at least one product query parameter for a target product to a product graph database that stores a relational map constructed based on a manufacturing process of the target product and describing entities including product entities and manufacturing entities and entity relations therebetween involved in the manufacturing process, querying the product graph database according to the product query parameter to obtain product history data of the target product by searching for a product entity corresponding to the target product as a target product entity in the relational map according to the parameter, searching for associated manufacturing entities of the target product entity according to the entity relations, obtaining the product history data based on the associated manufacturing entities, and sending a notification message to notify obtained product history data.

Abstract: Provided is a data processing device and method, and a computer-readable storage medium. The data processing device includes a memory and a processor performing following operations based on instructions stored in the memory: extracting first data from a first data table in a relational factory database at a first extraction cycle a duration of which is greater than 1 minute, the first data including data updated by the factory during the first extraction cycle; storing the first data into a second data table of a distributed storage system to form second data; inserting the second data into a third data table of the distributed storage system to form third data after data integrating the second data; and calling data in the third data table for data analysis processing at a first analysis cycle a duration of which is not smaller than the duration of the first extraction cycle.

Abstract: The present disclosure provides a method and device for detecting an image category. The method includes: acquiring a sample data set including a plurality of sample images labeled with a category, the sample data set including a training data set and a verification data set; training a deep learning model using the training data set to obtain, according to different numbers of training rounds, at least two trained models; testing the at least two trained models using the verification data set to generate a verification test result; generating, based on the verification test result, a verification test index; determining, according to the verification test index, a target model from the at least two trained models; and predict a to-be-tested image of the target object using the target model to obtain the category of the to-be-tested image.

Abstract: The present disclosure relates to a task processing method and device based on defect detection, a computer readable storage medium, and a task processing apparatus . The method includes receiving a detection task; determining a task type of the detection task; storing the detection task in a task queue if the task type is a target task type; and executing the detection task in a preset order and generating a feedback signal when a processor is idle. The detection task of the target task type includes an inference task and a training task. Executing the training task includes modifying configuration information according to a preset rule based on product information in the detection task; acquiring training data and an initial model according to the product information; and using the training data to train the initial model according to the configuration information to obtain a target model and store it in memory.

Abstract: The present disclosure provides an electronic device, a method for generating a package drawing, and a computer readable storage medium. The electronic device includes a display device and a processor, the processor is configured to obtain a type of the element and size parameters corresponding to the element input by a user; determine a size and a position of each of pads corresponding to the element according to the type of the element and the size parameters corresponding to the element, and draw the pads; determine coordinates of endpoints of an entity layer corresponding to the element, and draw the entity layer; determine coordinates of endpoints of a height layer corresponding to the element, and draw the height layer; and determine coordinates of endpoints of a screen layer corresponding to the element, and draw the screen layer.

Abstract: An image marking method, apparatus and system, which relates to the technical field of image processing. The present disclosure includes, when the working mode of the first client is a first mode, receiving a first marking task assigned by a second client, on the condition that the image marking approach is the first marking approach, according to a neural network model, determining a first marking result corresponding to the first original image; on the condition that the image marking approach is the second marking approach, according to an unsupervised algorithm model, determining a second marking result corresponding to the first original image; on the condition that the image marking approach is the third marking approach, receiving a third marking result inputted by a user into the first original image; and sending a target marking result to the second client.

Abstract: A computer-implemented method for defect analysis is provided. The computer-implemented method includes calculating a plurality of weight-of-evidence (WOE) scores respectively for a plurality of device operations with respect to detects occurred during a fabrication period, a higher WOE score indicating a higher correlation between a defect and a device operation; and ranking the plurality of WOE scores to obtain a list of selected device operations highly correlated with the defects occurred during the fabrication period, device operations in the list of selected device operations having a WOE score greater than a first threshold score. A respective one of the plurality of device operations is a respective device defined by a respective operation site at which the respective device perform a respective operation.

Abstract: The present disclosure provides a detection device of a display panel. The detection device includes: an image receiver configured to receive a detection image of a display panel to be detected; a detector configured to input the detection image of the display panel to be detected into a detection model and generate a detection result by the detection model, the detection model is pre-constructed and configured to detect the display panel. The disclosure also provides a detection method of the display panel, an electronic device and a computer readable medium.

Abstract: A tongue-image-based diagnostic system and a tongue-image-based diagnostic method are disclosed. The diagnostic system includes a parameter collector configured to acquire environmental parameter information; a model establishment circuitry configured to perform a training process using image training data and the environmental parameter information and establish an estimation model; and an analysis circuitry configured to analyze acquired image information using the estimation model, and generate an analysis result corresponding to the acquired image information.

Abstract: The present disclosure provides a production programming system based on a nonlinear program model, including: a distributed storage device and an analysis device, wherein the analysis device includes a processor configured to obtain production record information; construct the nonlinear program model based on the production record information; and solve the nonlinear program model to obtain first feasible solutions. The nonlinear program model includes a constraint condition that satisfies process requirements and an objective function indicating pressure equilibrium across the same device set, and each of the first feasible solutions is configured to indicate a production program. The present disclosure further provides a production programming method and a computer-readable storage medium which can improve efficiency and reduce device idleness rate.