Patents by Inventor Donghyeon Son

Donghyeon Son has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • RECLINER FOR VEHICLE SEAT
    Publication number: 20240051436
    Abstract: A recliner for a vehicle seat includes a first gear having a collar part at a center thereof, a second gear being internally in contact with the first gear and configured to eccentrically engage with the first gear, a socket including a first coupling portion having an outer diameter portion coupled to be in contact with an inner diameter portion of the collar part, and a second coupling portion having an inner diameter portion coupled to surround an outer diameter portion of the collar part while being in contact with the outer diameter portion of the collar part, and a pair of wedge cams disposed between the socket and the second gear and configured to restrain or release the socket and the second gear.
    Type: Application
    Filed: June 15, 2023
    Publication date: February 15, 2024
    Inventors: Sungchul KIM, Donghyeon SON
  • Apparatus for scanning nano structure with plural AFM probes and method thereof
    Patent number: 9581617
    Abstract: Plural AFM probes with different resolutions are implemented on an apparatus for scanning a nearly free-standing nanometer-scale specimen. The apparatus identifies the location and the shape of the nano structure on a specimen piece using a high resolution AFM probe, and then measures a three-dimensional shape of the identified nano structure using an atomic resolution AFM probe.
    Type: Grant
    Filed: December 28, 2015
    Date of Patent: February 28, 2017
    Assignee: Korea Advanced Institute of Science and Technology
    Inventors: Jhinhwan Lee, Donghyeon Son
  • Apparatus for Scanning Nano Structure with Plural AFM Probes and Method Thereof
    Publication number: 20160231351
    Abstract: Plural AFM probes with different resolutions are implemented on an apparatus for scanning a nearly free-standing nanometer-scale specimen. The apparatus identifies the location and the shape of the nano structure on a specimen piece using a high resolution AFM probe, and then measures a three-dimensional shape of the identified nano structure using an atomic resolution AFM probe.
    Type: Application
    Filed: December 28, 2015
    Publication date: August 11, 2016
    Inventors: Jhinhwan Lee, Donghyeon Son