Abstract: Provided is a display apparatus in which an area of a dead space is significantly reduced, the display apparatus including a first scan line extending in a first direction, a second scan line spaced apart from the first scan line and extending in the first direction, a first pixel set disposed between the first scan line and the second scan line, the first pixel set including a 1-1st pixel including n sub-pixels and a 1-2nd pixel including n sub-pixels, and n first data lines spaced apart from each other, disposed between the 1-1st pixel and the 1-2nd pixel in a plan view, extending in a second direction crossing the first direction, and electrically connected to the 1-1st pixel and the 1-2nd pixel.

Abstract: A recliner for a vehicle seat includes a first gear having a collar part at a center thereof, a second gear being internally in contact with the first gear and configured to eccentrically engage with the first gear, a socket including a first coupling portion having an outer diameter portion coupled to be in contact with an inner diameter portion of the collar part, and a second coupling portion having an inner diameter portion coupled to surround an outer diameter portion of the collar part while being in contact with the outer diameter portion of the collar part, and a pair of wedge cams disposed between the socket and the second gear and configured to restrain or release the socket and the second gear.

Abstract: Plural AFM probes with different resolutions are implemented on an apparatus for scanning a nearly free-standing nanometer-scale specimen. The apparatus identifies the location and the shape of the nano structure on a specimen piece using a high resolution AFM probe, and then measures a three-dimensional shape of the identified nano structure using an atomic resolution AFM probe.

Abstract: Plural AFM probes with different resolutions are implemented on an apparatus for scanning a nearly free-standing nanometer-scale specimen. The apparatus identifies the location and the shape of the nano structure on a specimen piece using a high resolution AFM probe, and then measures a three-dimensional shape of the identified nano structure using an atomic resolution AFM probe.