Patents by Inventor Dong Ju Ok

Dong Ju Ok has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9190160
    Abstract: A method of determining a read voltage of a memory device includes performing a plurality of read operations with respective different read voltages on a first group of storage regions of the memory device using a first error correction rate, wherein the plurality of read operations are performed to distinguish between a pair of adjacent logic states of memory cells in the first group of storage regions, detecting a read voltage level, among the different read voltages, at which a minimum number of erroneous bits is generated in the at least one read operation, and determining a read voltage for a second group of storage regions to which a second error correction rate is applied, based on the detected read voltage level, wherein the first error correction rate is higher than the second error correction rate.
    Type: Grant
    Filed: July 23, 2013
    Date of Patent: November 17, 2015
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Dong-Ju Ok, Hye-Ry No, Kyoung-Lae Cho, Sue-Jin Kim
  • Publication number: 20140043903
    Abstract: A method of determining a read voltage of a memory device comprises performing a plurality of read operations with respective different read voltages on a first group of storage regions of the memory device using a first error correction rate, wherein the plurality of read operations are performed to distinguish between a pair of adjacent logic states of memory cells in the first group of storage regions, detecting a read voltage level, among the different read voltages, at which a minimum number of erroneous bits is generated in the at least one read operation, and determining a read voltage for a second group of storage regions to which a second error correction rate is applied, based on the detected read voltage level, wherein the first error correction rate is higher than the second error correction rate.
    Type: Application
    Filed: July 23, 2013
    Publication date: February 13, 2014
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: DONG-JU OK, HYE-RY NO, KYOUNG-LAE CHO, SUE-JIN KIM
  • Publication number: 20130117635
    Abstract: Disclosed is a method of controlling a nonvolatile memory device which includes programming data in a user data area of the nonvolatile memory device and state information on logical states of the data in a meta area of the nonvolatile memory device; and adjusting levels of a plurality of read voltages using the state information to read the data from the user data area using the plurality of read voltages having the adjusted levels.
    Type: Application
    Filed: July 17, 2012
    Publication date: May 9, 2013
    Inventors: Dong Ju Ok, Kyoung Lae Cho, Dongsub Kim