Abstract: A semiconductor system includes a first semiconductor device and a second semiconductor device. The first semiconductor device outputs a test mode enable signal and a switch control signal and receives test data. The second semiconductor device generates first internal data and second internal data in response to the test mode enable signal, drives a first pad in response to the first internal data, drives a second pad in response to the second internal data, and drives a third pad in response to the first and second internal data according to the switch control signal.

Abstract: A semiconductor system includes a first semiconductor device and a second semiconductor device. The first semiconductor device outputs a test mode enable signal and a switch control signal and receives test data. The second semiconductor device generates first internal data and second internal data in response to the test mode enable signal, drives a first pad in response to the first internal data, drives a second pad in response to the second internal data, and drives a third pad in response to the first and second internal data according to the switch control signal.

Abstract: A reference voltage generating circuit in a semiconductor memory apparatus comprises a driving control signal generating unit configured to generate a driving control signal according to a temperature variation, wherein the driving control signal generating unit is enabled in response to a power-up signal, a driving unit configured to control a voltage level, which is applied to a voltage transfer node, in response to the power-up signal and the driving control signal, and a reference voltage generating unit configured to generate a reference voltage when a voltage level on the voltage transfer node is higher than a predetermined voltage level.

Abstract: A voltage down converter includes a voltage comparator for comparing a first reference voltage and an internal voltage to provide a first driving signal; a driving signal controller coupled with the voltage comparator, the driving signal controller configured to generate a second driving signal in response to an external voltage and selectively providing any one of the first and second driving signals; and a voltage supply coupled with the driving signal controller, the voltage supply configured to receive the selectively provided first and second driving signals, wherein the voltage supply is activated in accordance with the first or second driving signal, thereby providing the internal voltage.

Abstract: A reference voltage generating circuit in a semiconductor memory apparatus comprises a driving control signal generating unit configured to generate a driving control signal according to a temperature variation, wherein the driving control signal generating unit is enabled in response to a power-up signal, a driving unit configured to control a voltage level, which is applied to a voltage transfer node, in response to the power-up signal and the driving control signal, and a reference voltage generating unit configured to generate a reference voltage when a voltage level on the voltage transfer node is higher than a predetermined voltage level.

Abstract: A reference voltage generating circuit in a semiconductor memory apparatus comprises a driving control signal generating unit configured to generate a driving control signal according to a temperature variation, wherein the driving control signal generating unit is enabled in response to a power-up signal, a driving unit configured to control a voltage level, which is applied to a voltage transfer node, in response to the power-up signal and the driving control signal, and a reference voltage generating unit configured to generate a reference voltage when a voltage level on the voltage transfer node is higher than a predetermined voltage level.

Abstract: A voltage down converter includes a voltage comparator for comparing a first reference voltage and an internal voltage to provide a first driving signal; a driving signal controller coupled with the voltage comparator, the driving signal controller configured to generate a second driving signal in response to an external voltage and selectively providing any one of the first and second driving signals; and a voltage supply coupled with the driving signal controller, the voltage supply configured to receive the selectively provided first and second driving signals, wherein the voltage supply is activated in accordance with the first or second driving signal, thereby providing the internal voltage.

Abstract: A voltage down converter includes a voltage comparator for comparing a first reference voltage and an internal voltage to provide a first driving signal; a driving signal controller coupled with the voltage comparator, the driving signal controller configured to generate a second driving signal in response to an external voltage and selectively providing any one of the first and second driving signals; and a voltage supply coupled with the driving signal controller, the voltage supply configured to receive the selectively provided first and second driving signals, wherein the voltage supply is activated in accordance with the first or second driving signal, thereby providing the internal voltage.

Abstract: A bulk voltage (VBB) level sensor for a semiconductor memory apparatus is disclosed. The VBB level detector includes a reference voltage generator for generating a first reference voltage of which level varies with temperature, a reference voltage comparator for receiving a second reference voltage and the first reference voltage to generate a third reference voltage, a bias generator for receiving the third reference voltage to generate a specific bias level, and a VBB sensor for receiving the bias level to detect VBB level.

Abstract: An apparatus includes a plurality of first driving signal driving units, and generates a first driving signal by driving an input signal, a plurality of second driving signal driving units, each of which drives an input signal and generates a second driving signal, a timing control unit that controls each of the first driving signal driving units such that a predetermined time difference is generated between an enable timing of the first driving signal and an enable timing of the second driving signal, a plurality of sense amplifier driving units, each of which generates a first driving level and a second driving level according to the first driving signal and the second driving signal, and a plurality of sense amplifiers that are provided for respective bit line pairs, and each include first type switching elements operating according to the first driving level and second type switching elements operating according to the second driving level.

Abstract: An apparatus includes a plurality of first driving signal driving units, and generates a first driving signal by driving an input signal, a plurality of second driving signal driving units, each of which drives an input signal and generates a second driving signal, a timing control unit that controls each of the first driving signal driving units such that a predetermined time difference is generated between an enable timing of the first driving signal and an enable timing of the second driving signal, a plurality of sense amplifier driving units, each of which generates a first driving level and a second driving level according to the first driving signal and the second driving signal, and a plurality of sense amplifiers that are provided for respective bit line pairs, and each include first type switching elements operating according to the first driving level and second type switching elements operating according to the second driving level.

Abstract: An internal voltage generator includes an internal voltage detecting unit that receives an active signal activated in an active operation mode of a semiconductor memory and a bias voltage varying according to temperature variation, detects a level of an internal voltage by using a reference voltage and outputs an internal voltage pumping signal activated according to the level of the internal voltage.

Abstract: A voltage pumping device for generating a high voltage that is a boosted voltage is disclosed. The voltage pumping device includes an oscillator for generating a first pulse signal or second pulse signal in response to a control signal, and a high voltage pump for pumping a high voltage of a constant level in response to the first pulse signal or second pulse signal.

Abstract: An internal voltage generator includes an internal voltage detecting unit that receives an active signal activated in an active operation mode of a semiconductor memory and a bias voltage varying according to temperature variation, detects a level of an internal voltage by using a reference voltage and outputs an internal voltage pumping signal activated according to the level of the internal voltage.

Abstract: An apparatus for controlling a voltage includes a reference voltage generator that generates reference voltage, and a bulk bias voltage generator that generates a bulk bias voltage using the reference voltage supplied by the reference voltage generator, and supplies the bulk bias voltage to the reference voltage generator to control the reference voltage.

Abstract: A reference voltage generating circuit in a semiconductor memory apparatus comprises a driving control signal generating unit configured to generate a driving control signal according to a temperature variation, wherein the driving control signal generating unit is enabled in response to a power-up signal, a driving unit configured to control a voltage level, which is applied to a voltage transfer node, in response to the power-up signal and the driving control signal, and a reference voltage generating unit configured to generate a reference voltage when a voltage level on the voltage transfer node is higher than a predetermined voltage level.

Abstract: A voltage down converter includes a voltage comparator for comparing a first reference voltage and an internal voltage to provide a first driving signal; a driving signal controller coupled with the voltage comparator, the driving signal controller configured to generate a second driving signal in response to an external voltage and selectively providing any one of the first and second driving signals; and a voltage supply coupled with the driving signal controller, the voltage supply configured to receive the selectively provided first and second driving signals, wherein the voltage supply is activated in accordance with the first or second driving signal, thereby providing the internal voltage.

Abstract: A voltage pumping device for generating a high voltage that is a boosted voltage is disclosed. The voltage pumping device includes an oscillator for generating a first pulse signal or second pulse signal in response to a control signal, and a high voltage pump for pumping a high voltage of a constant level in response to the first pulse signal or second pulse signal.

Abstract: A capacitor structure and a method of fabricating the capacitor structure wherein. The lower electrode and the upper electrode are constructed to be separated from each other by a predetermined interval and to be engaged with each other using a series of alternating ridges so that an effective surface area can increase within a limited area.

Abstract: An apparatus for controlling a voltage includes a reference voltage generator that generates reference voltage, and a bulk bias voltage generator that generates a bulk bias voltage using the reference voltage supplied by the reference voltage generator, and supplies the bulk bias voltage to the reference voltage generator to control the reference voltage.