Patents by Inventor Dong-Kyoo Park

Dong-Kyoo Park has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Flash memory test system and method capable of test time reduction
    Patent number: 7254757
    Abstract: A flash memory test system capable of test time reduction and an electrical test method using the same: The invention provides a parallel tester that includes a first memory and a second memory. The first and second memories are used to each supply different data to identical addresses within a plurality of DUTs, thereby making it possible to conduct in parallel tests such as trim tests, repair tests, and invalid block masking test. Thus parallel testing is done to replace testing that was previously done serially.
    Type: Grant
    Filed: September 29, 2004
    Date of Patent: August 7, 2007
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Dong-Kyoo Park, Jong-Kook Kim, Jeong-Ho Bang, Sang-Young Choi, Eun-Sik Kim
  • Flash memory test system and method capable of test time reduction
    Publication number: 20050102589
    Abstract: A flash memory test system capable of test time reduction and an electrical test method using the same: The invention provides a parallel tester that includes a first memory and a second memory. The first and second memories are used to each supply different data to identical addresses within a plurality of DUTs, thereby making it possible to conduct in parallel tests such as trim tests, repair tests, and invalid block masking test. Thus parallel testing is done to replace testing that was previously done serially.
    Type: Application
    Filed: September 29, 2004
    Publication date: May 12, 2005
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Dong-Kyoo Park, Jong-Kook Kim, Jeong-Ho Bang, Sang-Young Choi, Eun-Sik Kim