Patents by Inventor Dong Pyo HAN

Dong Pyo HAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for measuring resistance of light emitting diode
    Patent number: 10921357
    Abstract: Disclosed are a method and device for measuring the resistance of a light-emitting diode that can measure the resistance value of the light-emitting diode accurately in a non-destructive manner. The disclosed method may include: measuring a first radiative current component of an injected current for the light-emitting diode by using the internal quantum efficiency of the light-emitting diode; generating a second radiative current component by modeling the first radiative current component; and computing a resistance value of the light-emitting diode by using the first and second radiative current components resulting from an applied voltage to the light-emitting diode.
    Type: Grant
    Filed: February 18, 2016
    Date of Patent: February 16, 2021
    Assignee: INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY ERICA CAMPUS
    Inventors: Jong-In Shim, Dong Pyo Han, Dong-Soo Shin
  • METHOD AND APPARATUS FOR MEASURING RESISTANCE OF LIGHT EMITTING DIODE
    Publication number: 20180143231
    Abstract: Disclosed are a method and device for measuring the resistance of a light-emitting diode that can measure the resistance value of the light-emitting diode accurately in a non-destructive manner. The disclosed method may include: measuring a first radiative current component of an injected current for the light-emitting diode by using the internal quantum efficiency of the light-emitting diode; generating a second radiative current component by modeling the first radiative current component; and computing a resistance value of the light-emitting diode by using the first and second radiative current components resulting from an applied voltage to the light-emitting diode.
    Type: Application
    Filed: February 18, 2016
    Publication date: May 24, 2018
    Applicant: INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY ERICA CAMPUS
    Inventors: Jong-In SHIM, Dong Pyo HAN, Dong-Soo SHIN
  • Method and device for measuring internal quantum efficiency of an optical element
    Patent number: 9945898
    Abstract: A method for measuring the efficiency of an optical element is disclosed.
    Type: Grant
    Filed: July 31, 2013
    Date of Patent: April 17, 2018
    Assignee: ETAMAX.CO., LTD
    Inventors: Jong-In Shim, Dong Pyo Han, Hyun Don Jung
  • METHOD AND DEVICE FOR MEASURING INTERNAL QUANTUM EFFICIENCY OF AN OPTICAL ELEMENT
    Publication number: 20150323463
    Abstract: A method for measuring the efficiency of an optical element is disclosed.
    Type: Application
    Filed: July 31, 2013
    Publication date: November 12, 2015
    Inventors: Jong-In SHIM, Dong Pyo HAN, Hyun Don JUNG