Abstract: A word line driving circuit for use in a semiconductor memory device having a first supply voltage terminal to which a pumping voltage higher than a supply voltage supplied from the exterior of a chip is applied and a second supply voltage terminal to which a ground voltage is applied includes a decoding circuit connected between the first supply voltage terminal and second supply voltage terminal, for receiving a decoded row address, a precharge circuit connected to an output terminal of the decoding circuit, a transfer circuit for receiving an output signal of the decoding circuit and a word line boosting signal, and a word line output circuit connected between the first supply voltage terminal and second supply voltage terminal, for driving a word line.

Abstract: An improved data transmission circuit for complementary metal oxide semiconductor (CMOS) dynamic random access memory devices having a data input buffer for converting transistor-transistor logic (TTL) input data signals to CMOS logic level true and complement data signals is described. The data transmission circuit includes a pair of transmission gates for transferring the true and complement data signals in a write cycle, a pair of inverting stages connected between respective ones of the transmission gates and true and complement input/output (I/O) bus lines for inverting data signals from the transmission gates to provide the inverted data signals to true and complement I/O bus lines in the write cycle and an equalizing stage for precharging and equalizing true and complement I/O bus lines in a precharge cycle.