Abstract: Provided is a method for manufacturing a composition for increasing cognitive function.

Abstract: Methods and systems for executing tracking and monitoring manufacturing data of a battery are disclosed. One method includes: receiving, by a server system, sensing data of the battery from a sensing system; generating, by the server system, mapping data based on the sensing data; generating, by the server system, identification data of the battery based on the sensing data; generating, by the server system, monitoring data of the battery based on the sensing data, the identification data, and the mapping data; and generating, by the server system, display data for displaying a simulated electrode of the battery on a graphical user interface based on the monitoring data of the battery.

Abstract: An arrangement of a word line driver stage for semiconductor memory device is disclosed. The present invention is characterized in that a word line driver stages are into several sub-stages WD11-WD51 within a memory cell array, and each word line extending from a first one or a second one of the sub-stages is alternatively coupled to the sub-stage adjacent thereto. Thus this arrangement is capable of reducing the signal transmission delay and eliminating the adverse factor in the current critical design rule and layout.

Abstract: Disclosed is a data transmission circuit with a higher data access time and allowing for higher chip density, used for a semiconductor memory device. A pre-amplifier connects segmented I/O lines with data I/O lines, amplifies weak voltage from the bit lines and is mounted on the strapping area of the chip so as to secure the high chip density.

Abstract: A semiconductor integrated circuit chip has an identification circuit connected between a power voltage supply terminal and one of the input terminals of the chip. The identification circuity includes a voltage limiter to limit the input potential difference between the power voltage supply terminal and the input terminal to a predetermined voltage level. The identification circuit further includes an option device connected to the voltage limiter to provide identification information of the chip. According to the identification circuit, chip identification testing may be achieved with existing input/output and power supply terminals, thereby eliminating the need for extra test and diagnosis pins or additional identification equipment employed during testing.