Abstract: A semiconductor device includes an N-well between first and second P-wells. N-type active regions including first and second N-type active regions are disposed in the N-well. A shortest distance between a boundary of the second P-well and the N-well and the second N-type active region is larger than a shortest distance between a boundary of the first P-well and the N-well and the first N-type active region. A first P-gate dielectric layer including a first modulation layer is provided on the first N-type active region. The first modulation layer includes a first intermediate modulation layer between lower and upper modulation layers. A second P-gate dielectric layer including a second modulation layer is provided on the second N-type active region. The second modulation layer includes a second intermediate modulation layer between the lower and upper modulation layers. The first intermediate modulation layer is thicker than the second intermediate modulation layer.

Abstract: A semiconductor device includes a horizontal layer spaced apart from a lower structure to extend in a direction parallel to the lower structure; a vertical conductive line extending in a direction perpendicular to the lower structure and coupled to a first-side end of the horizontal layer; a data storage element coupled to a second-side end of the horizontal layer; and a horizontal conductive line including a first horizontal conductive line and a second horizontal conductive line that are vertically asymmetrical with the horizontal layer interposed therebetween.

Abstract: A semiconductor integrated circuit device and a fabrication method thereof are disclosed. The resistive memory device includes a lower electrode, a resistive layer formed in a resistance change region on the lower electrode, an upper electrode formed on the resistive layer, and an insertion layer configured to allow a reset current path of the resistive layer, which is formed from the upper electrode to the lower electrode, to be bypassed in a direction perpendicular to or parallel to a surface of the lower electrode.

Abstract: In a method of manufacturing a semiconductor integrated circuit device, an active region including a nano-wire may be formed on a bulk insulating layer. A hard mask pattern may be formed to partially expose the nano-wire. A work function-controlling region may be formed on the nano-wire exposed through the hard mask pattern. The hard mask pattern may be removed. A gate insulating layer may be formed on the nano-wire. A gate may be formed to surround the nano-wire.

Abstract: A semiconductor integrated circuit device may include an isolating layer, a buried gate, source and drain regions, a dielectric layer having a high dielectric constant and an insulating interlayer. The isolating layer may be formed on a semiconductor substrate to define an active region. The buried gate may be formed in the active region of the semiconductor substrate. The source and drain regions may be formed in the active region at both sides of the buried gate. The dielectric layer may be configured to surround the source and drain regions. The insulating interlayer may be formed on the dielectric layer.

Abstract: A fuse structure may include an anode pattern, a cathode pattern and a connection member. The anode pattern may be formed on a semiconductor substrate. The cathode pattern may be formed on the anode pattern. The connection member may be electrically connected between the anode pattern and the cathode pattern. The connection member may have different widths.

Abstract: A semiconductor integrated circuit device and a fabrication method thereof are disclosed. The resistive memory device includes a lower electrode, a resistive layer formed in a resistance change region on the lower electrode, an upper electrode formed on the resistive layer, and an insertion layer configured to allow a reset current path of the resistive layer, which is formed from the upper electrode to the lower electrode, to be bypassed in a direction perpendicular to or parallel to a surface of the lower electrode.

Abstract: In a method for manufacturing a transistor, a gate structure may be formed on a semiconductor substrate. A first material layer may be formed on the gate structure to expose an upper sidewall of the gate structure. A spacer including a second material layer may be formed on the upper sidewall of the gate structure. The first material layer may be isotropically etched using the spacer as an etch mask to form a space. An insulating interlayer may be formed on the semiconductor substrate. The insulating interlayer may not be formed in the space.

Abstract: In a method of manufacturing a semiconductor integrated circuit device, an active region including a nano-wire may be formed on a bulk insulating layer. A hard mask pattern may be formed to partially expose the nano-wire. A work function-controlling region may be formed on the nano-wire exposed through the hard mask pattern. The hard mask pattern may be removed. A gate insulating layer may be formed on the nano-wire. A gate may be formed to surround the nano-wire.

Abstract: A fuse structure may include an anode pattern, a cathode pattern and a connection member. The anode pattern may be formed on a semiconductor substrate. The cathode pattern may be formed on the anode pattern. The connection member may be electrically connected between the anode pattern and the cathode pattern. The connection member may have different widths.

Abstract: In a method of manufacturing a semiconductor integrated circuit device, an active region including a nano-wire may be formed on a bulk insulating layer. A hard mask pattern may be formed to partially expose the nano-wire. A work function-controlling region may be formed on the nano-wire exposed through the hard mask pattern. The hard mask pattern may be removed. A gate insulating layer may be formed on the nano-wire. A gate may be formed to surround the nano-wire.

Abstract: In a method for manufacturing a transistor, a gate structure may be formed on a semiconductor substrate. A first material layer may be formed on the gate structure to expose an upper sidewall of the gate structure. A spacer including a second material layer may be formed on the upper sidewall of the gate structure. The first material layer may be isotropically etched using the spacer as an etch mask to form a space. An insulating interlayer may be formed on the semiconductor substrate. The insulating interlayer may not be formed in the space.

Abstract: A fuse structure may include an anode pattern, a cathode pattern and a connection member. The anode pattern may be formed on a semiconductor substrate. The cathode pattern may be formed on the anode pattern. The connection member may be electrically connected between the anode pattern and the cathode pattern. The connection member may have different widths.

Abstract: A fuse structure may include an anode pattern, a cathode pattern and a connection member. The anode pattern may be formed on a semiconductor substrate. The cathode pattern may be formed on the anode pattern. The connection member may be electrically connected between the anode pattern and the cathode pattern. The connection member may have different widths.

Abstract: A fuse structure may include an anode pattern, a cathode pattern and a connection member. The anode pattern may be formed on a semiconductor substrate. The cathode pattern may be formed on the anode pattern. The connection member may be electrically connected between the anode pattern and the cathode pattern. The connection member may have different widths.

Abstract: A fuse structure may include an anode pattern, a cathode pattern and a connection member. The anode pattern may be formed on a semiconductor substrate. The cathode pattern may be formed on the anode pattern. The connection member may be electrically connected between the anode pattern and the cathode pattern. The connection member may have different widths.

Abstract: In a method of manufacturing a semiconductor integrated circuit device, an active region including a nano-wire may be formed on a bulk insulating layer. A hard mask pattern may be formed to partially expose the nano-wire. A work function-controlling region may be formed on the nano-wire exposed through the hard mask pattern. The hard mask pattern may be removed. A gate insulating layer may be formed on the nano-wire. A gate may be formed to surround the nano-wire.

Abstract: A semiconductor integrated circuit device may include an isolating layer, a buried gate, source and drain regions, a dielectric layer having a high dielectric constant and an insulating interlayer. The isolating layer may be formed on a semiconductor substrate to define an active region. The buried gate may be formed in the active region of the semiconductor substrate. The source and drain regions may be formed in the active region at both sides of the buried gate. The dielectric layer may be configured to surround the source and drain regions. The insulating interlayer may be formed on the dielectric layer.

Abstract: A semiconductor device includes a first active region including at least one first recess; a second active region including at least one second recess; an isolation region including a diffusion barrier that laterally surrounds at least any one active region of the first active region and the second active region; a first recess gate filled in the first recess; and a second recess gate filled in the second recess, wherein the diffusion barrier contacts ends of at least any one of the first recess gate and the second recess gate.

Abstract: An integrated circuit includes a NAND string including a string selection transistor SST and a ground selection transistor GST disposed at either end of series-connected memory storage cells MC. Each of the memory storage cells is a memory transistor having a floating gate, and at least one of the string selection transistor SST and the ground selection transistor GST is a memory transistor having a floating gate. The threshold voltage Vth of programmable string selection transistors SST and the ground selection transistor GST is variable and user controllable and need not be established by implantation during manufacture. Each of the programmable string selection transistors SST and the ground selection transistors GST in a memory block may be used to store random data, thus increasing the memory storage capacity of the flash memory device.