Abstract: A semiconductor device includes a memory core circuit configured to generate core data from bank data outputted by a bank or generate the core data from a dummy column address based on a read operation for the bank. The semiconductor device also includes a data control circuit configured to generate a switching signal from a bank active signal or a dummy bank address based on the read operation for the bank and and configured to control the output of the core data based on the switching signal.

Abstract: A semiconductor device includes a memory core circuit configured to generate core data from bank data outputted by a bank or generate the core data from a dummy column address based on a read operation for the bank. The semiconductor device also includes a data control circuit configured to generate a switching signal from a bank active signal or a dummy bank address based on the read operation for the bank and and configured to control the output of the core data based on the switching signal.

Abstract: A semiconductor device may include a first column decoder arranged at a first side of a bank, wherein the first column decoder is enabled by a first column decoder select signal. The semiconductor device may include a second column decoder arranged at a second side of the bank, wherein the second column decoder is enabled by a second column decoder select signal; and wherein the bank is arranged between the first column decoder and the second column decoder. The semiconductor device may further include a column decoder selection circuit suitable for activating any one of the first and second column decoder select signals based on a row address.

Abstract: A semiconductor device may include a first column decoder arranged at a first side of a bank, wherein the first column decoder is enabled by a first column decoder select signal. The semiconductor device may include a second column decoder arranged at a second side of the bank, wherein the second column decoder is enabled by a second column decoder select signal; and wherein the bank is arranged between the first column decoder and the second column decoder. The semiconductor device may further include a column decoder selection circuit suitable for activating any one of the first and second column decoder select signals based on a row address.

Abstract: The semiconductor device may include an address conversion circuit configured for generating a variable address. The semiconductor device may include a column decoder configured for generating a first output select signal or a second output select signal from a column address based on the variable address.

Abstract: A precharge control device includes a pulse generator, a bank address controller, and a precharge signal generator. The pulse generator generates a write precharge signal in response to a write burst end signal activated after a write burst operation and a read precharge signal in response to a read burst end signal activated after a read burst operation. The bank address controller generates a write address and a read address designating an address for the precharge operation in response to a write bank address and a read bank address. The precharge signal generator generates a precharge signal for performing the precharge operation in a bank selected in response to the write address when the write precharge signal is activated, or generates a precharge signal for performing the precharge operation in a bank selected in response to the read address when the read precharge signal is activated.

Abstract: A semiconductor device may be provided. The semiconductor device may include a target address storage circuit and a first row address generation circuit. The target address storage circuit may be configured to count the number of times that blocks are selected by a plurality of logic level combinations of an address based on an active pulse. The target address storage circuit may be configured to store and output the address of a target block, which is selected at least a predetermined number of times, among the blocks as a target address. The first row address generation circuit may be configured to generate a first row address, which is counted, from the target address based on a first internal command.

Abstract: A precharge control device includes a pulse generator, a bank address controller, and a precharge signal generator. The pulse generator generates a write precharge signal in response to a write burst end signal activated after a write burst operation and a read precharge signal in response to a read burst end signal activated after a read burst operation. The bank address controller generates a write address and a read address designating an address for the precharge operation in response to a write bank address and a read bank address. The precharge signal generator generates a precharge signal for performing the precharge operation in a bank selected in response to the write address when the write precharge signal is activated, or generates a precharge signal for performing the precharge operation in a bank selected in response to the read address when the read precharge signal is activated.

Abstract: A semiconductor device may be provided. The semiconductor device may include a target address storage circuit and a first row address generation circuit. The target address storage circuit may be configured to count the number of times that blocks are selected by a plurality of logic level combinations of an address based on an active pulse. The target address storage circuit may be configured to store and output the address of a target block, which is selected at least a predetermined number of times, among the blocks as a target address. The first row address generation circuit may be configured to generate a first row address, which is counted, from the target address based on a first internal command.

Abstract: A semiconductor device may be provided. The semiconductor device may include an address conversion circuit configured for generating a converted address. The semiconductor device may include a column decoder configured for generating a first output select signal or a second output select signal from a column address based on the converted address.

Abstract: A semiconductor device includes a skew sensing block configured to generate a first output signal according to a driving force for driving a first internal node and generate a second output signal according to a driving force for driving a second internal node, in response to an input signal; and a skew control signal generation block configured to generate skew control signals for controlling a skew of an internal circuit, by the first and second output signals.

Abstract: A semiconductor device includes a skew sensing block configured to generate a first output signal according to a driving force for driving a first internal node and generate a second output signal according to a driving force for driving a second internal node, in response to an input signal; and a skew control signal generation block configured to generate skew control signals for controlling a skew of an internal circuit, by the first and second output signals.

Abstract: A counter circuit includes a lower count signal generation unit suitable for generating a lower bit, an upper count signal generation unit suitable for generating an upper bit, and a control unit suitable for determining a counting route in response to a control signal and controlling the lower and upper count signal generation units based on a determined route, wherein in a first route, the upper bit is generated in response to the lower bit, and in a second route, the lower bit is generated in response to the upper bit.

Abstract: A semiconductor memory apparatus includes an internal data generation block configured to generate test data in response to test signals, and output ones of normal data inputted from data input/output pads and the test data as internal data according to a test flag signal; a data storage region configured to receive and store the internal data, and output stored data as cell storage data; a latch block configured to receive and store the cell storage data in response to a data output enable signal, and output stored data as latch data; and a data comparison block configured to compare the test data and the latch data, and generate a test result signal.

Abstract: A semiconductor memory apparatus includes an internal data generation block configured to generate test data in response to test signals, and output ones of normal data inputted from data input/output pads and the test data as internal data according to a test flag signal; a data storage region configured to receive and store the internal data, and output stored data as cell storage data; a latch block configured to receive and store the cell storage data in response to a data output enable signal, and output stored data as latch data; and a data comparison block configured to compare the test data and the latch data, and generate a test result signal.

Abstract: A semiconductor device includes first and second circuits disposed separately from each other. The first circuit may include: a counting unit suitable for generating count codes, each bit of which is cyclically changing, wherein the count codes include a number of toggles of a sampling signal toggling with a preset frequency representing a distance of single round trip of the sampling signal between the first and second circuits; and a pulse generation unit suitable for generating a measurement pulse according to the count codes representing the distance, wherein the pulse generation unit determines a pulse width of the measurement pulse according to the distance.

Abstract: A semiconductor device includes first and second circuits disposed separately from each other. The first circuit may include: a counting unit suitable for generating count codes, each bit of which is cyclically changing, wherein the count codes include a number of toggles of a sampling signal toggling with a preset frequency representing a distance of single round trip of the sampling signal between the first and second circuits; and a pulse generation unit suitable for generating a measurement pulse according to the count codes representing the distance, wherein the pulse generation unit determines a pulse width of the measurement pulse according to the distance.

Abstract: A counter circuit includes a lower count signal generation unit suitable for generating a lower bit, an upper count signal generation unit suitable for generating an upper bit, and a control unit suitable for determining a counting route in response to a control signal and controlling the lower and upper count signal generation units based on a determined route, wherein in a first route, the upper bit is generated in response to the lower bit, and in a second route, the lower bit is generated in response to the upper bit.