Patents by Inventor Dong-Yueh Liang

Dong-Yueh Liang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Radiation modulation in a security examination apparatus
    Patent number: 9121957
    Abstract: Radiation flux can be adjusted “on the fly” as an object (204) is being scanned in a security examination apparatus. Adjustments are made to the radiation flux based upon radiation incident on a first radiation detector (226) in an upstream portion (233) of an examination region. The object under examination is thus exposed to different radiation flux in coordination with a downstream motion (235) of the object relative to a second radiation detector (228). The radiation flux is adjusted so that a sufficient number of x-rays (that traverse the object) are incident on the second radiation detector. Images of the object can then be generated based upon data from the second radiation detector, where these images are thus of a desired/higher quality.
    Type: Grant
    Filed: October 14, 2008
    Date of Patent: September 1, 2015
    Assignee: Analogic Corporation
    Inventors: Ram C. Naidu, Chitra Subramanian, Sergey B. Simanovsky, Zhengrong Ying, Dong-Yueh Liang, Douglas Q. Abraham
  • RADIATION MODULATION IN A SECURITY EXAMINATION APPARATUS
    Publication number: 20110200167
    Abstract: Radiation flux can be adjusted “on the fly” as an object (204) is being scanned in a security examination apparatus. Adjustments are made to the radiation flux based upon radiation incident on a first radiation detector (226) in an upstream portion (233) of an examination region. The object under examination is thus exposed to different radiation flux in coordination with a downstream motion (235) of the object relative to a second radiation detector (228). The radiation flux is adjusted so that a sufficient number of x-rays (that traverse the object) are incident on the second radiation detector. Images of the object can then be generated based upon data from the second radiation detector, where these images are thus of a desired/higher quality.
    Type: Application
    Filed: October 14, 2008
    Publication date: August 18, 2011
    Inventors: Ram C. Naidu, Chitra Subramanian, Sergey B. Simanovsky, Zhengrong Ying, Dong-Yueh Liang, Douglas Q. Abraham