Abstract: An x-ray source for improved electron beam control, a smaller electron beam spot size, and a smaller x-ray spot size with reduced power supply size and weight. A method for improved electron beam control, a smaller electron beam spot size, and a smaller x-ray spot size with reduced power supply size and weight. Grid(s) may be used in an x-ray tube for improved electron beam control, a smaller electron beam spot size, and a smaller x-ray spot size. Control circuitry for the grid(s) can be disposed in electrically insulative potting. Light may be used to provide power and control signals to the control circuitry.

Abstract: A cold electron number amplifier device can provide a greater number of electrons at lower electron emitter temperature. The cold electron number amplifier device can comprise an evacuated enclosure 11, a first electron emitter 12 attached to the evacuated enclosure 11, and an electrically conductive second electron emitter 13 also attached to the evacuated enclosure. The first electron emitter 12 can be configured to emit electrons 14 within the evacuated enclosure 11. The second electron emitter 13 can have a voltage V2 greater than a voltage V1 of the first electron emitter 12 (V2>V1). The second electron emitter 13 can be positioned to receive impinging electrons 14 from the first electron emitter 12. Electrons 14 from the first electron emitter 12 can impart energy to electrons in the second electron emitter 13 and cause the second electron emitter 13 to emit more electrons 15.

Abstract: A high voltage device includes a circuit board 12 surrounded by an enclosure 11, potting 13 to provide electrical insulation between the circuit board 12 and the enclosure 11, and a layer of material 14, having a different resistivity than a resistivity of the potting 13, dividing the potting into separate and discrete sections. The layer of material 14 can be multiple layers. Each layer 14 can have a voltage applied, and a voltage of any layer 14 closer to the circuit board 12 can have a higher absolute value than any layer 14 farther from the circuit board 12.

Abstract: A circuit providing reliable voltage isolation between a low and high voltage sides of a circuit while allowing AC power transfer between the low and high voltage sides of the circuit to an x-ray tube filament. Capacitors provide the isolation between the low and high voltage sides of the circuit.

Abstract: An x-ray source can include an x-ray tube and a power supply. The x-ray tube can be removably affixed to the power supply in a rigid manner with the x-ray tube movable and holdable along with the power supply when affixed thereto. A releasable coupling between the x-ray tube and the power supply can create an interface defining a potential arc path. A means, such as a non-linear plug and socket junction, a gasket, or an electrically conductive sleeve, can be used for resisting arcing along the potential arc path.

Abstract: A high voltage sensing circuit with temperature compensation comprises a first series of resistors in parallel with a second series of resistors. The first series includes a material with a different temperature coefficient of resistance than in the second series. A voltage measurement circuit calculates a high voltage by use of a voltage across a resistor in the first series and a voltage differential between the series.

Abstract: A circuit providing reliable voltage isolation between a low and high voltage sides of a circuit while allowing AC power transfer between the low and high voltage sides of the circuit to an x-ray tube filament. Capacitors provide the isolation between the low and high voltage sides of the circuit.

Abstract: A laser-cooled fluorescence mass spectrometry apparatus includes an ion trap for trapping sample ions, laser-cooled ions, and probe ions therein; a first irradiating device for irradiating the sample ions, the laser-cooled ions, and the probe ions in the ion trap with a first laser beam for cooling the ions; a second irradiating device for irradiating the sample ions, the laser-cooled ions, and the probe ions in the ion trap with a second laser beam for detecting temperature changes in the ions; a detecting device for detecting the temperature changes in the ions; a first ion source for the sample ions; a second ion source for the laser-cooled ions; and a third ion source for the probe ions. The probe ions may be different ions than the laser-cooled ions, or the probe ions may be the same ions as the laser-cooled ions.

Abstract: A laser-cooled fluorescence mass spectrometry apparatus includes an ion trap for trapping sample ions, laser-cooled ions, and probe ions therein; a first irradiating device for irradiating the sample ions, the laser-cooled ions, and the probe ions in the ion trap with a first laser beam for cooling the ions; a second irradiating device for irradiating the sample ions, the laser-cooled ions, and the probe ions in the ion trap with a second laser beam for detecting temperature changes in the ions; a detecting device for detecting the temperature changes in the ions; a first ion source for the sample ions; a second ion source for the laser-cooled ions; and a third ion source for the probe ions. The probe ions may be different ions than the laser-cooled ions, or the probe ions may be the same ions as the laser-cooled ions.

Abstract: A laser-cooled fluorescence mass spectrometry and device thereof capable of non-destructive analysis with acquiring a strong signal intensity by separating the laser cooling means and the ion temperature probe means.