Abstract: A high voltage sensing circuit with temperature compensation comprises a first series of resistors in parallel with a second series of resistors. The first series includes a material with a different temperature coefficient of resistance than in the second series. A voltage measurement circuit calculates a high voltage by use of a voltage across a resistor in the first series and a voltage differential between the series.

Abstract: A circuit providing reliable voltage isolation between a low and high voltage sides of a circuit while allowing AC power transfer between the low and high voltage sides of the circuit to an x-ray tube filament. Capacitors provide the isolation between the low and high voltage sides of the circuit.

Abstract: A laser-cooled fluorescence mass spectrometry apparatus includes an ion trap for trapping sample ions, laser-cooled ions, and probe ions therein; a first irradiating device for irradiating the sample ions, the laser-cooled ions, and the probe ions in the ion trap with a first laser beam for cooling the ions; a second irradiating device for irradiating the sample ions, the laser-cooled ions, and the probe ions in the ion trap with a second laser beam for detecting temperature changes in the ions; a detecting device for detecting the temperature changes in the ions; a first ion source for the sample ions; a second ion source for the laser-cooled ions; and a third ion source for the probe ions. The probe ions may be different ions than the laser-cooled ions, or the probe ions may be the same ions as the laser-cooled ions.

Abstract: A laser-cooled fluorescence mass spectrometry apparatus includes an ion trap for trapping sample ions, laser-cooled ions, and probe ions therein; a first irradiating device for irradiating the sample ions, the laser-cooled ions, and the probe ions in the ion trap with a first laser beam for cooling the ions; a second irradiating device for irradiating the sample ions, the laser-cooled ions, and the probe ions in the ion trap with a second laser beam for detecting temperature changes in the ions; a detecting device for detecting the temperature changes in the ions; a first ion source for the sample ions; a second ion source for the laser-cooled ions; and a third ion source for the probe ions. The probe ions may be different ions than the laser-cooled ions, or the probe ions may be the same ions as the laser-cooled ions.

Abstract: A laser-cooled fluorescence mass spectrometry and device thereof capable of non-destructive analysis with acquiring a strong signal intensity by separating the laser cooling means and the ion temperature probe means.