Abstract: Certain embodiments of the present invention relate to a dynamic power management system. The system includes a power input providing power to an imaging system, measurement unit(s) for measuring current and/or voltage in the imaging system, and a power management controller allocating available power among components in the imaging system. The power management controller may allow a battery to charge at a maximum rate based on current used by the imaging system components. The measurement unit(s) may measure a voltage and a current for the power provided to the imaging system. The power management controller may control current drawn by the imaging system components. The system may also include a limit sensor for detecting when current consumption exceeds a certain limit. Additionally, the system may include at least one switching unit controlled by the power management controller. The switching unit(s) control an amount of power routed to imaging system components.

Abstract: A method and apparatus employed in an X-ray apparatus for compensating for attenuation caused by a subject to perform an improved X-ray exposure. A table is created comprising entries accessible via power and attenuation values. Each of the entries includes a first value T representing a time for radiation in the system to reach a base ion count, and a second value C representing an offset ion count from the base ion count. A first set of entries in the table are referenced using a first power setting, and a first base ion count is determined based upon the first power setting, and a maximum radiation exposure is determined for the first power setting and a subject's mass. Then, an X-ray emitter is activated until a current ion count from a radiation sampling means has exceeded the base ion count or total radiation emitted has exceeded the maximum radiation allowed for the given mass of a subject.

Abstract: A method and apparatus employed in an X-ray apparatus for compensating for attenuation caused by a subject to perform an improved X-ray exposure. A table is created comprising entries accessible via power and attenuation values. Each of the entries includes a first value T representing a time for radiation in the system to reach a base ion count, and a second value C representing an offset ion count from the base ion count. A first set of entries in the table are referenced using a first power setting, and a first base ion count is determined based upon the first power setting, and a maximum radiation exposure is determined for the first power setting and a subject's mass. Then, an X-ray emitter is activated until a current ion count from a radiation sampling means has exceeded the base ion count or total radiation emitted has exceeded the maximum radiation allowed for the given mass of a subject.