Abstract: A semiconductor memory device includes a third insulating pattern and a first insulating pattern on a substrate, the third insulating pattern and the first insulating pattern being spaced apart from each other in a first direction that is perpendicular to the substrate such that a bottom surface of the third insulating pattern and a top surface of the first insulating pattern face each other, a gate electrode between the bottom surface of the third insulating pattern and the top surface of the first insulating pattern, and including a first side extending between the bottom surface of the third insulating pattern and the top surface of the first insulating pattern, and a second insulating pattern that protrudes from the first side of the gate electrode by a second width in a second direction, the second direction being different from the first direction.

Abstract: One embodiment of the present invention provides a method of manufacturing an electronic device using a cyclic doping process including i) an operation of forming a unit transfer thin film including a two-dimensional material on a transfer substrate, ii) an operation of doping the unit transfer thin film in a low-damage doping process, iii) an operation of transferring the unit transfer thin film doped according to the operation ii) on a transfer target substrate, and iv) an operation of repeatedly performing the operations i) to iii) several times to reach a target thickness.

Abstract: A method for manufacturing a semiconductor device and a semiconductor device produced thereby. For example and without limitation, various aspects of this disclosure provide methods for manufacturing a semiconductor device, and semiconductor devices produced thereby, that comprise forming an interposer including a reinforcement layer.

Abstract: The present disclosure relates to a plurality of host materials, an organic electroluminescent compound, and an organic electroluminescent device comprising the same. By comprising a specific combination of compounds according to the present disclosure as a plurality of host materials or by comprising the compound according to the present disclosure, it is possible to produce an organic electroluminescent device having lower driving voltage, higher luminous efficiency, and/or longer lifetime properties compared to the conventional organic electroluminescent devices.

Abstract: Disclosed are a system and a method for precisely measuring a structure are disclosed. A reference meter installed at a fixed location provides GPS reference information. A plurality of response meters, respectively installed at a plurality of positions of the structure, acquire acceleration information through acceleration sensors and measure a plurality of real-time kinematic (RTK) displacement data based on the GPS reference information, respectively. The response meters synchronize acceleration information with the plurality of RTK displacement data measured to generate into a packet to be transmitted. An operation processor receives the acceleration information and the plurality of RTK displacement data and calculates structure response information. With the GPS and accelerometers, the dynamic behaviors of structures including high-rise buildings, bridges, dams, and harbors can be precisely measured.

Abstract: Disclosed are a system and a method for precisely measuring a structure are disclosed. A reference meter installed at a fixed location provides GPS reference information. A plurality of response meters, respectively installed at a plurality of positions of the structure, acquire acceleration information through acceleration sensors and measure a plurality of real-time kinematic (RTK) displacement data based on the GPS reference information, respectively. The response meters synchronize acceleration information with the plurality of RTK displacement data measured to generate into a packet to be transmitted. An operation processor receives the acceleration information and the plurality of RTK displacement data and calculates structure response information. With the GPS and accelerometers, the dynamic behaviors of structures including high-rise buildings, bridges, dams, and harbors can be precisely measured.