Abstract: An apparatus comprising a first core layer having a first thickness and a first refractive index; a second core layer formed on the first core layer, the second core layer having a second thickness and a second refractive index; and a grating formed at the interface between the first core layer and the second core layer. Corresponding process and system embodiments are disclosed and claimed.

Abstract: An apparatus comprising a first core layer having a first thickness and a first refractive index; a second core layer formed on the first core layer, the second core layer having a second thickness and a second refractive index; and a grating formed at the interface between the first core layer and the second core layer. Corresponding process and system embodiments are disclosed and claimed.

Abstract: An apparatus and method to provide a tapered electrode in an acoustic resonator. A piezoelectric (PZ) layer, such as Aluminum Nitride (AlN), is formed over a bottom electrode having a tapered end. A top electrode is positioned on the PZ layer. The tapered end of the bottom electrode creates a mild topography to the under layer of the PZ material to prevent cracking in the PZ layer. The tapered end also decreases acoustic losses in the acoustic resonator because the PZ grains are highly oriented. In one embodiment, the acoustic resonator is a film bulk acoustic resonator (FBAR).

Abstract: An apparatus and method to provide a tapered electrode in an acoustic resonator. A piezoelectric (PZ) layer, such as Aluminum Nitride (AlN), is formed over a bottom electrode having a tapered end. A top electrode is positioned on the PZ layer. The tapered end of the bottom electrode creates a mild topography to the under layer of the PZ material to prevent cracking in the PZ layer. The tapered end also decreases acoustic losses in the acoustic resonator because the PZ grains are highly oriented. In one embodiment, the acoustic resonator is a film bulk acoustic resonator (FBAR).

Abstract: An apparatus and method to provide a tapered electrode in an acoustic resonator. A piezoelectric (PZ) layer, such as Aluminum Nitride (AIN), is formed over a bottom electrode having a tapered end. A top electrode is positioned on the PZ layer. The tapered end of the bottom electrode creates a mild topography to the under layer of the PZ material to prevent cracking in the PZ layer. The tapered end also decreases acoustic losses in the acoustic resonator because the PZ grains are highly oriented. In one embodiment, the acoustic resonator is a film bulk acoustic resonator (FBAR).

Abstract: An apparatus and method for reducing a mode size of an optical beam with a dual taper waveguide device. In one embodiment, an apparatus according to embodiments of the present invention includes a buried tapered waveguide disposed in a semiconductor layer. The apparatus further includes a tapered rib waveguide disposed in the semiconductor layer proximate to the buried tapered waveguide. The tapered rib waveguide includes a rib portion adjoining a slab portion. The slab portion of the rib waveguide adjoins the buried tapered waveguide. An optical beam is directed into a larger end of the buried tapered waveguide and the tapered rib waveguide. The buried tapered waveguide is tapered to guide the optical beam therethrough into the slab portion of the rib waveguide.

Abstract: An apparatus and method to provide a tapered electrode in an acoustic resonator. A piezoelectric (PZ) layer, such as Aluminum Nitride (AIN), is formed over a bottom electrode having a tapered end. A top electrode is positioned on the PZ layer. The tapered end of the bottom electrode creates a mild topography to the under layer of the PZ material to prevent cracking in the PZ layer. The tapered end also decreases acoustic losses in the acoustic resonator because the PZ grains are highly oriented. In one embodiment, the acoustic resonator is a film bulk acoustic resonator (FBAR).