Patents by Inventor Doron Shilo

Doron Shilo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for reducing peak to average power ratio
    Patent number: 11949542
    Abstract: This application relates to the field of communications technologies, in particularly related to wireless fidelity (WIFI) technologies, and provides a method and apparatus for reducing peak to average power ratio (PAPR) for transmitting a physical layer protocol data units (PPDUs). The method can be used for both an access point (AP) and a station (STA). The method comprises: operating on a first disregard bits sequence to obtain a second disregard bits sequence, wherein the first disregard bits sequence is with all bits set to ‘1’, and transmitting the PPDU, wherein the PPDU comprises the second disregard bits sequence.
    Type: Grant
    Filed: June 30, 2023
    Date of Patent: April 2, 2024
    Assignee: Huawei Technologies Co., Ltd.
    Inventors: Shimon Shilo, Oded Redlich, Ezer Melzer, Doron Ezri, Yoav Levinbook, Genadiy Tsodik, Jian Yu, Mengshi Hu
  • Method and apparatus for measuring the mechanical response of micro-electro-mechanical systems
    Patent number: 7444880
    Abstract: The present invention relates to the field measuring the mechanical response of micro-electro-mechanical systems. More specifically, the present invention pertains to a method and apparatus that allows the direct control of the load applied to a Micro-Electro-Mechanical System in order to measure the mechanical response. The system comprises a loading sub-system, a displacement measurement sub-system, and an optional observation sub-system.
    Type: Grant
    Filed: December 13, 2004
    Date of Patent: November 4, 2008
    Assignee: California Institute of Technology
    Inventors: Rongjing Zhang, Guruswami Ravichandran, Doron Shilo, Kaushik Bhattacharya
  • Method and apparatus for measuring the mechanical response of micro-electro-mechanical systems
    Publication number: 20050223810
    Abstract: The present invention relates to the field measuring the mechanical response of micro-electro-mechanical systems. More specifically, the present invention pertains to a method and apparatus that allows the direct control of the load applied to a Micro-Electro-Mechanical System in order to measure the mechanical response. The system comprises a loading sub-system, a displacement measurement sub-system, and an optional observation sub-system.
    Type: Application
    Filed: December 13, 2004
    Publication date: October 13, 2005
    Inventors: Rongjing Zhang, Guruswami Ravichandran, Doron Shilo, Kaushik Bhattacharya