Patents by Inventor Doug Gotthard

Doug Gotthard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240058832
    Abstract: A treatment system, including a conveyor bed configured to transport a plurality of products; a brushing device located along the conveyor bed and having one or more brushes that include a first antimicrobial compound; a surface treatment device including a lamp configured to emit light of a peak wavelength directed toward a portion of the conveyor bed; and a coating device configured to deliver a coating mixture onto the plurality of products on the conveyor bed.
    Type: Application
    Filed: September 26, 2023
    Publication date: February 22, 2024
    Inventors: Ronald C. Bakus, Matthew Kahlscheuer, Gregory Faust, Louis Perez, Anuj Purohit, Krishnan Chari, Benjamin Gordon, Nicholas Feringa, Doug Gotthard
  • Patent number: 11813636
    Abstract: A treatment system, including a conveyor bed configured to transport a plurality of products; a brushing device located along the conveyor bed and having one or more brushes that include a first antimicrobial compound; a surface treatment device including a lamp configured to emit light of a peak wavelength directed toward a portion of the conveyor bed; and a coating device configured to deliver a coating mixture onto the plurality of products on the conveyor bed.
    Type: Grant
    Filed: March 16, 2022
    Date of Patent: November 14, 2023
    Assignee: Apeel Technology, Inc.
    Inventors: Ronald C. Bakus, Matthew Kahlscheuer, Gregory Faust, Louis Perez, Anuj Purohit, Krishnan Chari, Benjamin Gordon, Nicholas Feringa, Doug Gotthard
  • Publication number: 20220297153
    Abstract: A treatment system, including a conveyor bed configured to transport a plurality of products; a brushing device located along the conveyor bed and having one or more brushes that include a first antimicrobial compound; a surface treatment device including a lamp configured to emit light of a peak wavelength directed toward a portion of the conveyor bed; and a coating device configured to deliver a coating mixture onto the plurality of products on the conveyor bed.
    Type: Application
    Filed: March 16, 2022
    Publication date: September 22, 2022
    Inventors: Ronald C. Bakus, Matthew Kahlscheuer, Gregory Faust, Louis Perez, Anuj Purohit, Krishnan Chari, Benjamin Gordon, Nicholas Feringa, Doug Gotthard
  • Patent number: 10557789
    Abstract: Described are techniques for obtaining spectroscopic information from sub-micron regions of a sample using a probe microscope. The current invention uses the response of an AFM cantilever at a plurality of frequencies to substantially reduce the impact of background absorption away from the sub-micron region of interest. This innovation substantially improves the quality of spectra for top down illumination of samples that are not suitable for bottoms up illumination of the prior art.
    Type: Grant
    Filed: July 31, 2013
    Date of Patent: February 11, 2020
    Assignee: Bruker Nano, Inc.
    Inventors: Craig Prater, Kevin Kjoller, Doug Gotthard, Qichi Hu
  • Publication number: 20150034826
    Abstract: Described are techniques for obtaining spectroscopic information from sub-micron regions of a sample using a probe microscope. The current invention uses the response of an AFM cantilever at a plurality of frequencies to substantially reduce the impact of background absorption away from the sub-micron region of interest. This innovation substantially improves the quality of spectra for top down illumination of samples that are not suitable for bottoms up illumination of the prior art.
    Type: Application
    Filed: July 31, 2013
    Publication date: February 5, 2015
    Inventors: Craig Prater, Kevin Kjoller, Doug Gotthard, Qichi Hu
  • Patent number: 8914911
    Abstract: Described are methods for magnetically actuating microcantilevers and magnetically actuated and self-heated microcantilevers. Also described are methods for determining viscoelastic properties and thermal transition temperatures of materials.
    Type: Grant
    Filed: March 14, 2013
    Date of Patent: December 16, 2014
    Assignees: The Board of Trustees of the University of Illinois, Anasys Instruments
    Inventors: William P. King, Craig Prater, Byeonghee Lee, Doug Gotthard
  • Patent number: 8242448
    Abstract: Dynamic IR radiation power control, beam steering and focus adjustment for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination with a beam from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illumination at the sample is dynamically decreased to minimize sample overheating in locations/wavelengths where absorption is high and increased in locations/wavelengths where absorption is low to maintain signal to noise. Beam alignment and focus optimization as a function of wavelength are automatically performed.
    Type: Grant
    Filed: November 9, 2010
    Date of Patent: August 14, 2012
    Assignee: Anasys Instruments Corporation
    Inventors: Craig Prater, Michael Lo, Doug Gotthard, Anthony Kurtz, Kevin Kjoller
  • Patent number: 8177422
    Abstract: A system and method for automatic analysis of temperature transition data over an area of a sample surface. The system relies on the use of a microfabricated probe, which can be rapidly heated and cooled and has a sharp tip to provide high spatial resolution. The system also has fast x-y-z positioners, data collection, and algorithms that allow automatic analysis of and visualization of temperature transition data.
    Type: Grant
    Filed: August 15, 2008
    Date of Patent: May 15, 2012
    Assignee: Anasys Instruments
    Inventors: Kevin Kjoller, Khoren Sahagian, Doug Gotthard, Anthony Kurtz, Craig Prater, Roshan Shetty, Michael Reading
  • Publication number: 20110205527
    Abstract: Dynamic IR radiation power control, beam steering and focus adjustment for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination with a beam from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illumination at the sample is dynamically decreased to minimize sample overheating in locations/wavelengths where absorption is high and increased in locations/wavelengths where absorption is low to maintain signal to noise. Beam alignment and focus optimization as a function of wavelength are automatically performed.
    Type: Application
    Filed: November 9, 2010
    Publication date: August 25, 2011
    Inventors: Craig Prater, Michael Lo, Doug Gotthard, Anthony Kurtz, Kevin Kjoller
  • Publication number: 20100042356
    Abstract: A system and method for automatic analysis of temperature transition data over an area of a sample surface. The system relies on the use of a microfabricated probe, which can be rapidly heated and cooled and has a sharp tip to provide high spatial resolution. The system also has fast x-y-z positioners, data collection, and algorithms that allow automatic analysis of and visualization of temperature transition data.
    Type: Application
    Filed: August 15, 2008
    Publication date: February 18, 2010
    Inventors: Kevin Kjoller, Khoren Sahagian, Doug Gotthard, Anthony Kurtz, Craig Prater, Roshan Shetty, Michael Reading
  • Patent number: 7478552
    Abstract: A method of operating a probe based instrument includes a light source that generates and directs a beam of light towards a probe of the instrument to detect a property of probe deflection. The method automatically adjusts the position of the light beam on the probe based on movement of the probe by a Z actuator so as to eliminate apparent parasitic deflection of the probe. A light source assembly for detecting deflection of a probe preferably includes a base, a tip/tilt stage mounted on the base and a light source supported by the tip/tilt stage. The tip/tilt stage includes at least one electrically actuated fine adjustment actuator that controls the tip/tilt stage, preferably independently of movement of the AFM scanner used to move the probe.
    Type: Grant
    Filed: March 21, 2006
    Date of Patent: January 20, 2009
    Assignee: Veeco Instruments Inc.
    Inventors: Doug Gotthard, Ben Ohler
  • Patent number: 7387035
    Abstract: A force scanning probe microscope (FSPM) and associated method of making force measurements on a sample includes a piezoelectric scanner having a surface that supports the sample so as to move the sample in three orthogonal directions. The FSPM also includes a displacement sensor that measures movement of the sample in a direction orthogonal to the surface and generates a corresponding position signal so as to provide closed loop position feedback. In addition, a probe is fixed relative to the piezoelectric scanner, while a deflection detection apparatus is employed to sense a deflection of the probe. The FSPM also includes a controller that generates a scanner drive signal based on the position signal, and is adapted to operate according to a user-defined input that can change a force curve measurement parameter during data acquisition.
    Type: Grant
    Filed: May 16, 2006
    Date of Patent: June 17, 2008
    Assignee: Veeco Instruments Inc.
    Inventors: Jens Struckmeier, Doug Gotthard, Ben Ohler
  • Publication number: 20070220958
    Abstract: A method of operating a probe based instrument includes a light source that generates and directs a beam of light towards a probe of the instrument to detect a property of probe deflection. The method automatically adjusts the position of the light beam on the probe based on movement of the probe by a Z actuator so as to eliminate apparent parasitic deflection of the probe. A light source assembly for detecting deflection of a probe preferably includes a base, a tip/tilt stage mounted on the base and a light source supported by the tip/tilt stage. The tip/tilt stage includes at least one electrically actuated fine adjustment actuator that controls the tip/tilt stage, preferably independently of movement of the AFM scanner used to move the probe.
    Type: Application
    Filed: March 21, 2006
    Publication date: September 27, 2007
    Applicant: Veeco Instruments Inc.
    Inventors: Doug Gotthard, Ben Ohler
  • Publication number: 20060283240
    Abstract: A force scanning probe microscope (FSPM) and associated method of making force measurements on a sample includes a piezoelectric scanner having a surface that supports the sample so as to move the sample in three orthogonal directions. The FSPM also includes a displacement sensor that measures movement of the sample in a direction orthogonal to the surface and generates a corresponding position signal so as to provide closed loop position feedback. In addition, a probe is fixed relative to the piezoelectric scanner, while a deflection detection apparatus is employed to sense a deflection of the probe. The FSPM also includes a controller that generates a scanner drive signal based on the position signal, and is adapted to operate according to a user-defined input that can change a force curve measurement parameter during data acquisition.
    Type: Application
    Filed: May 16, 2006
    Publication date: December 21, 2006
    Inventors: Jens Struckmeier, Doug Gotthard, Ben Ohler
  • Patent number: 7044007
    Abstract: A force scanning probe microscope (FSPM) and associated method of making force measurements on a sample includes a piezoelectric scanner having a surface that supports the sample so as to move the sample in three orthogonal directions. The FSPM also includes a displacement sensor that measures movement of the sample in a direction orthogonal to the surface and generates a corresponding position signal so as to provide closed loop position feedback. In addition, a probe is fixed relative to the piezoelectric scanner, while a deflection detection apparatus is employed to sense a deflection of the probe. The FSPM also includes a controller that generates a scanner drive signal based on the position signal, and is adapted to operate according to a user-defined input that can change a force curve measurement parameter during data acquisition.
    Type: Grant
    Filed: January 13, 2004
    Date of Patent: May 16, 2006
    Assignee: Veeco Instruments Inc.
    Inventors: Jens Struckmeier, Doug Gotthard, Ben Ohler
  • Patent number: 7013717
    Abstract: A probe microscope includes a probe and a scanner, the scanner generating relative motion between a probe and a sample. In addition, a manual input device is provided to control a separation between a sample and a probe. The detector is used to generate a signal related to movement of the probe (for example, deflection). Moreover, the microscope has an alerting device that is responsive to the signal to provide feedback to an operator, the feedback being indicative of interaction between the sample and the probe. Preferably, the manual input device is a rotatable knob. Also, the alerting device is preferably a mechanical resistance device coupled to the knob to provide the feedback to the user.
    Type: Grant
    Filed: December 6, 2001
    Date of Patent: March 21, 2006
    Assignee: Veeco Instruments Inc.
    Inventors: Jens Struckmeier, Doug Gotthard, Ben Ohler
  • Publication number: 20050081610
    Abstract: A force scanning probe microscope (FSPM) and associated method of making force measurements on a sample includes a piezoelectric scanner having a surface that supports the sample so as to move the sample in three orthogonal directions. The FSPM also includes a displacement sensor that measures movement of the sample in a direction orthogonal to the surface and generates a corresponding position signal so as to provide closed loop position feedback. In addition, a probe is fixed relative to the piezoelectric scanner, while a deflection detection apparatus is employed to sense a deflection of the probe. The FSPM also includes a controller that generates a scanner drive signal based on the position signal, and is adapted to operate according to a user-defined input that can change a force curve measurement parameter during data acquisition.
    Type: Application
    Filed: January 13, 2004
    Publication date: April 21, 2005
    Inventors: Jens Struckmeier, Doug Gotthard, Ben Ohler
  • Patent number: 6677697
    Abstract: A force scanning probe microscope (FSPM) and associated method of making force measurements on a sample includes a piezoelectric scanner having a surface that supports the sample so as to move the sample in three orthogonal directions. The FSPM also includes a displacement sensor that measures movement of the sample in a direction orthogonal to the surface and generates a corresponding position signal so as to provide closed loop position feedback. In addition, a probe is fixed relative to the piezoelectric scanner, while a deflection detection apparatus is employed to sense a deflection of the probe. The FSPM also includes a controller that generates a scanner drive signal based on the position signal, and is adapted to operate according to a user-defined input that can change a force curve measurement parameter during data acquisition.
    Type: Grant
    Filed: December 6, 2001
    Date of Patent: January 13, 2004
    Assignee: Veeco Instruments Inc.
    Inventors: Jens Struckmeier, Doug Gotthard, Ben Ohler
  • Publication number: 20030110844
    Abstract: A force scanning probe microscope (FSPM) and associated method of making force measurements on a sample includes a piezoelectric scanner having a surface that supports the sample so as to move the sample in three orthogonal directions. The FSPM also includes a displacement sensor that measures movement of the sample in a direction orthogonal to the surface and generates a corresponding position signal so as to provide closed loop position feedback. In addition, a probe is fixed relative to the piezoelectric scanner, while a deflection detection apparatus is employed to sense a deflection of the probe. The FSPM also includes a controller that generates a scanner drive signal based on the position signal, and is adapted to operate according to a user-defined input that can change a force curve measurement parameter during data acquisition.
    Type: Application
    Filed: December 6, 2001
    Publication date: June 19, 2003
    Applicant: Veeco Instruments Inc.
    Inventors: Jens Struckmeier, Doug Gotthard, Ben Ohler