Patents by Inventor Doug Gotthard
Doug Gotthard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240058832Abstract: A treatment system, including a conveyor bed configured to transport a plurality of products; a brushing device located along the conveyor bed and having one or more brushes that include a first antimicrobial compound; a surface treatment device including a lamp configured to emit light of a peak wavelength directed toward a portion of the conveyor bed; and a coating device configured to deliver a coating mixture onto the plurality of products on the conveyor bed.Type: ApplicationFiled: September 26, 2023Publication date: February 22, 2024Inventors: Ronald C. Bakus, Matthew Kahlscheuer, Gregory Faust, Louis Perez, Anuj Purohit, Krishnan Chari, Benjamin Gordon, Nicholas Feringa, Doug Gotthard
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Patent number: 11813636Abstract: A treatment system, including a conveyor bed configured to transport a plurality of products; a brushing device located along the conveyor bed and having one or more brushes that include a first antimicrobial compound; a surface treatment device including a lamp configured to emit light of a peak wavelength directed toward a portion of the conveyor bed; and a coating device configured to deliver a coating mixture onto the plurality of products on the conveyor bed.Type: GrantFiled: March 16, 2022Date of Patent: November 14, 2023Assignee: Apeel Technology, Inc.Inventors: Ronald C. Bakus, Matthew Kahlscheuer, Gregory Faust, Louis Perez, Anuj Purohit, Krishnan Chari, Benjamin Gordon, Nicholas Feringa, Doug Gotthard
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Publication number: 20220297153Abstract: A treatment system, including a conveyor bed configured to transport a plurality of products; a brushing device located along the conveyor bed and having one or more brushes that include a first antimicrobial compound; a surface treatment device including a lamp configured to emit light of a peak wavelength directed toward a portion of the conveyor bed; and a coating device configured to deliver a coating mixture onto the plurality of products on the conveyor bed.Type: ApplicationFiled: March 16, 2022Publication date: September 22, 2022Inventors: Ronald C. Bakus, Matthew Kahlscheuer, Gregory Faust, Louis Perez, Anuj Purohit, Krishnan Chari, Benjamin Gordon, Nicholas Feringa, Doug Gotthard
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Patent number: 10557789Abstract: Described are techniques for obtaining spectroscopic information from sub-micron regions of a sample using a probe microscope. The current invention uses the response of an AFM cantilever at a plurality of frequencies to substantially reduce the impact of background absorption away from the sub-micron region of interest. This innovation substantially improves the quality of spectra for top down illumination of samples that are not suitable for bottoms up illumination of the prior art.Type: GrantFiled: July 31, 2013Date of Patent: February 11, 2020Assignee: Bruker Nano, Inc.Inventors: Craig Prater, Kevin Kjoller, Doug Gotthard, Qichi Hu
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Publication number: 20150034826Abstract: Described are techniques for obtaining spectroscopic information from sub-micron regions of a sample using a probe microscope. The current invention uses the response of an AFM cantilever at a plurality of frequencies to substantially reduce the impact of background absorption away from the sub-micron region of interest. This innovation substantially improves the quality of spectra for top down illumination of samples that are not suitable for bottoms up illumination of the prior art.Type: ApplicationFiled: July 31, 2013Publication date: February 5, 2015Inventors: Craig Prater, Kevin Kjoller, Doug Gotthard, Qichi Hu
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Patent number: 8914911Abstract: Described are methods for magnetically actuating microcantilevers and magnetically actuated and self-heated microcantilevers. Also described are methods for determining viscoelastic properties and thermal transition temperatures of materials.Type: GrantFiled: March 14, 2013Date of Patent: December 16, 2014Assignees: The Board of Trustees of the University of Illinois, Anasys InstrumentsInventors: William P. King, Craig Prater, Byeonghee Lee, Doug Gotthard
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Patent number: 8242448Abstract: Dynamic IR radiation power control, beam steering and focus adjustment for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination with a beam from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illumination at the sample is dynamically decreased to minimize sample overheating in locations/wavelengths where absorption is high and increased in locations/wavelengths where absorption is low to maintain signal to noise. Beam alignment and focus optimization as a function of wavelength are automatically performed.Type: GrantFiled: November 9, 2010Date of Patent: August 14, 2012Assignee: Anasys Instruments CorporationInventors: Craig Prater, Michael Lo, Doug Gotthard, Anthony Kurtz, Kevin Kjoller
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Patent number: 8177422Abstract: A system and method for automatic analysis of temperature transition data over an area of a sample surface. The system relies on the use of a microfabricated probe, which can be rapidly heated and cooled and has a sharp tip to provide high spatial resolution. The system also has fast x-y-z positioners, data collection, and algorithms that allow automatic analysis of and visualization of temperature transition data.Type: GrantFiled: August 15, 2008Date of Patent: May 15, 2012Assignee: Anasys InstrumentsInventors: Kevin Kjoller, Khoren Sahagian, Doug Gotthard, Anthony Kurtz, Craig Prater, Roshan Shetty, Michael Reading
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Publication number: 20110205527Abstract: Dynamic IR radiation power control, beam steering and focus adjustment for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination with a beam from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illumination at the sample is dynamically decreased to minimize sample overheating in locations/wavelengths where absorption is high and increased in locations/wavelengths where absorption is low to maintain signal to noise. Beam alignment and focus optimization as a function of wavelength are automatically performed.Type: ApplicationFiled: November 9, 2010Publication date: August 25, 2011Inventors: Craig Prater, Michael Lo, Doug Gotthard, Anthony Kurtz, Kevin Kjoller
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Publication number: 20100042356Abstract: A system and method for automatic analysis of temperature transition data over an area of a sample surface. The system relies on the use of a microfabricated probe, which can be rapidly heated and cooled and has a sharp tip to provide high spatial resolution. The system also has fast x-y-z positioners, data collection, and algorithms that allow automatic analysis of and visualization of temperature transition data.Type: ApplicationFiled: August 15, 2008Publication date: February 18, 2010Inventors: Kevin Kjoller, Khoren Sahagian, Doug Gotthard, Anthony Kurtz, Craig Prater, Roshan Shetty, Michael Reading
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Patent number: 7478552Abstract: A method of operating a probe based instrument includes a light source that generates and directs a beam of light towards a probe of the instrument to detect a property of probe deflection. The method automatically adjusts the position of the light beam on the probe based on movement of the probe by a Z actuator so as to eliminate apparent parasitic deflection of the probe. A light source assembly for detecting deflection of a probe preferably includes a base, a tip/tilt stage mounted on the base and a light source supported by the tip/tilt stage. The tip/tilt stage includes at least one electrically actuated fine adjustment actuator that controls the tip/tilt stage, preferably independently of movement of the AFM scanner used to move the probe.Type: GrantFiled: March 21, 2006Date of Patent: January 20, 2009Assignee: Veeco Instruments Inc.Inventors: Doug Gotthard, Ben Ohler
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Patent number: 7387035Abstract: A force scanning probe microscope (FSPM) and associated method of making force measurements on a sample includes a piezoelectric scanner having a surface that supports the sample so as to move the sample in three orthogonal directions. The FSPM also includes a displacement sensor that measures movement of the sample in a direction orthogonal to the surface and generates a corresponding position signal so as to provide closed loop position feedback. In addition, a probe is fixed relative to the piezoelectric scanner, while a deflection detection apparatus is employed to sense a deflection of the probe. The FSPM also includes a controller that generates a scanner drive signal based on the position signal, and is adapted to operate according to a user-defined input that can change a force curve measurement parameter during data acquisition.Type: GrantFiled: May 16, 2006Date of Patent: June 17, 2008Assignee: Veeco Instruments Inc.Inventors: Jens Struckmeier, Doug Gotthard, Ben Ohler
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Publication number: 20070220958Abstract: A method of operating a probe based instrument includes a light source that generates and directs a beam of light towards a probe of the instrument to detect a property of probe deflection. The method automatically adjusts the position of the light beam on the probe based on movement of the probe by a Z actuator so as to eliminate apparent parasitic deflection of the probe. A light source assembly for detecting deflection of a probe preferably includes a base, a tip/tilt stage mounted on the base and a light source supported by the tip/tilt stage. The tip/tilt stage includes at least one electrically actuated fine adjustment actuator that controls the tip/tilt stage, preferably independently of movement of the AFM scanner used to move the probe.Type: ApplicationFiled: March 21, 2006Publication date: September 27, 2007Applicant: Veeco Instruments Inc.Inventors: Doug Gotthard, Ben Ohler
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Publication number: 20060283240Abstract: A force scanning probe microscope (FSPM) and associated method of making force measurements on a sample includes a piezoelectric scanner having a surface that supports the sample so as to move the sample in three orthogonal directions. The FSPM also includes a displacement sensor that measures movement of the sample in a direction orthogonal to the surface and generates a corresponding position signal so as to provide closed loop position feedback. In addition, a probe is fixed relative to the piezoelectric scanner, while a deflection detection apparatus is employed to sense a deflection of the probe. The FSPM also includes a controller that generates a scanner drive signal based on the position signal, and is adapted to operate according to a user-defined input that can change a force curve measurement parameter during data acquisition.Type: ApplicationFiled: May 16, 2006Publication date: December 21, 2006Inventors: Jens Struckmeier, Doug Gotthard, Ben Ohler
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Patent number: 7044007Abstract: A force scanning probe microscope (FSPM) and associated method of making force measurements on a sample includes a piezoelectric scanner having a surface that supports the sample so as to move the sample in three orthogonal directions. The FSPM also includes a displacement sensor that measures movement of the sample in a direction orthogonal to the surface and generates a corresponding position signal so as to provide closed loop position feedback. In addition, a probe is fixed relative to the piezoelectric scanner, while a deflection detection apparatus is employed to sense a deflection of the probe. The FSPM also includes a controller that generates a scanner drive signal based on the position signal, and is adapted to operate according to a user-defined input that can change a force curve measurement parameter during data acquisition.Type: GrantFiled: January 13, 2004Date of Patent: May 16, 2006Assignee: Veeco Instruments Inc.Inventors: Jens Struckmeier, Doug Gotthard, Ben Ohler
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Patent number: 7013717Abstract: A probe microscope includes a probe and a scanner, the scanner generating relative motion between a probe and a sample. In addition, a manual input device is provided to control a separation between a sample and a probe. The detector is used to generate a signal related to movement of the probe (for example, deflection). Moreover, the microscope has an alerting device that is responsive to the signal to provide feedback to an operator, the feedback being indicative of interaction between the sample and the probe. Preferably, the manual input device is a rotatable knob. Also, the alerting device is preferably a mechanical resistance device coupled to the knob to provide the feedback to the user.Type: GrantFiled: December 6, 2001Date of Patent: March 21, 2006Assignee: Veeco Instruments Inc.Inventors: Jens Struckmeier, Doug Gotthard, Ben Ohler
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Publication number: 20050081610Abstract: A force scanning probe microscope (FSPM) and associated method of making force measurements on a sample includes a piezoelectric scanner having a surface that supports the sample so as to move the sample in three orthogonal directions. The FSPM also includes a displacement sensor that measures movement of the sample in a direction orthogonal to the surface and generates a corresponding position signal so as to provide closed loop position feedback. In addition, a probe is fixed relative to the piezoelectric scanner, while a deflection detection apparatus is employed to sense a deflection of the probe. The FSPM also includes a controller that generates a scanner drive signal based on the position signal, and is adapted to operate according to a user-defined input that can change a force curve measurement parameter during data acquisition.Type: ApplicationFiled: January 13, 2004Publication date: April 21, 2005Inventors: Jens Struckmeier, Doug Gotthard, Ben Ohler
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Patent number: 6677697Abstract: A force scanning probe microscope (FSPM) and associated method of making force measurements on a sample includes a piezoelectric scanner having a surface that supports the sample so as to move the sample in three orthogonal directions. The FSPM also includes a displacement sensor that measures movement of the sample in a direction orthogonal to the surface and generates a corresponding position signal so as to provide closed loop position feedback. In addition, a probe is fixed relative to the piezoelectric scanner, while a deflection detection apparatus is employed to sense a deflection of the probe. The FSPM also includes a controller that generates a scanner drive signal based on the position signal, and is adapted to operate according to a user-defined input that can change a force curve measurement parameter during data acquisition.Type: GrantFiled: December 6, 2001Date of Patent: January 13, 2004Assignee: Veeco Instruments Inc.Inventors: Jens Struckmeier, Doug Gotthard, Ben Ohler
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Publication number: 20030110844Abstract: A force scanning probe microscope (FSPM) and associated method of making force measurements on a sample includes a piezoelectric scanner having a surface that supports the sample so as to move the sample in three orthogonal directions. The FSPM also includes a displacement sensor that measures movement of the sample in a direction orthogonal to the surface and generates a corresponding position signal so as to provide closed loop position feedback. In addition, a probe is fixed relative to the piezoelectric scanner, while a deflection detection apparatus is employed to sense a deflection of the probe. The FSPM also includes a controller that generates a scanner drive signal based on the position signal, and is adapted to operate according to a user-defined input that can change a force curve measurement parameter during data acquisition.Type: ApplicationFiled: December 6, 2001Publication date: June 19, 2003Applicant: Veeco Instruments Inc.Inventors: Jens Struckmeier, Doug Gotthard, Ben Ohler