Abstract: A coaxial radio frequency adapter and method are disclosed. An adapter has a tapered signal pin and a tapered ground sleeve to maintain a consistent impedance and minimize reflections while connecting two elements having different dimensions. A method employs an adapter to characterize losses in a system for evaluating a device under test.

Abstract: A coaxial radio frequency adapter and method are disclosed. An adapter has a tapered signal pin and a tapered ground sleeve to maintain a consistent impedance and minimize reflections while connecting two elements having different dimensions. A method employs an adapter to characterize losses in a system for evaluating a device under test.

Abstract: A coaxial radio frequency adapter is disclosed. An adapter has a tapered signal pin and a tapered ground sleeve to maintain a consistent impedance and minimize reflections while connecting two elements having different dimensions.

Abstract: A coaxial radio frequency adapter and method are disclosed. An adapter has a tapered signal pin and a tapered ground sleeve to maintain a consistent impedance and minimize reflections while connecting two elements having different dimensions. A method employs an adapter to characterize losses in a system for evaluating a device under test.

Abstract: A coaxial radio frequency adapter and method are disclosed. An adapter has a tapered signal pin and a tapered ground sleeve to maintain a consistent impedance and minimize reflections while connecting two elements having different dimensions. A method employs an adapter to characterize losses in a system for evaluating a device under test.

Abstract: A coaxial radio frequency adapter and method are disclosed. An adapter has a tapered signal pin and a tapered ground sleeve to maintain a consistent impedance and minimize reflections while connecting two elements having different dimensions. A method employs an adapter to characterize losses in a system for evaluating a device under test.

Abstract: A wafer handling wand allows the efficient loading and unloading of semiconductor wafers to and from a CMP apparatus. The wand includes identical work piece gripping, alignment, and loading/unloading mechanisms on the top and bottom sides. A processed wafer can be unloaded from the apparatus onto one side of the wand and an unprocessed wafer can be loaded into the apparatus from the second side. The gripping mechanism includes a support area and a spaced apart moveable gripping finger. Wafer loading is facilitated by a cam attached to the support area that rotates when the cam contacts the apparatus. Upon rotation, the cam provides a surface for directing the work piece into the apparatus. The surface of the cam also includes an alignment aid that can be brought into contact with a reference surface on the apparatus to insure proper alignment between the wand and the apparatus.

Abstract: A wafer handling wand allows the efficient loading and unloading of semiconductor wafers to and from a CMP apparatus. The wand includes identical work piece gripping, alignment, and loading/unloading mechanisms on the top and bottom sides. A processed wafer can be unloaded from the apparatus onto one side of the wand and an unprocessed wafer can be loaded into the apparatus from the second side. The gripping mechanism includes a support area and a spaced apart moveable gripping finger. Wafer loading is facilitated by a cam attached to the support area that rotates when the cam contacts the apparatus. Upon rotation, the cam provides a surface for directing the work piece into the apparatus. The surface of the cam also includes an alignment aid that can be brought into contact with a reference surface on the apparatus to insure proper alignment between the wand and the apparatus.