Patents by Inventor Doug Larson

Doug Larson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12014895
    Abstract: A multi-beam electronics scanning system using swathing. The system includes an electron emitter source configured to emit an illumination beam. The illumination beam is split into multiple electron beams by a beam splitter lens array. The system also includes an electronic deflection system configured to deflect each of the electron beams in a plurality of directions, including a first direction, along two different axes. Last, a swathing stage is used to move a sample with a constant velocity in a second direction that is parallel to the first direction.
    Type: Grant
    Filed: December 1, 2021
    Date of Patent: June 18, 2024
    Assignee: KLA Corporation
    Inventors: Tomas Plettner, Doug Larson, Mark Cawein, Jason W. Huang
  • Publication number: 20220199352
    Abstract: A multi-beam electronics scanning system using swathing. The system includes an electron emitter source configured to emit an illumination beam. The illumination beam is split into multiple electron beams by a beam splitter lens array. The system also includes an electronic deflection system configured to deflect each of the electron beams in a plurality of directions, including a first direction, along two different axes. Last, a swathing stage is used to move a sample with a constant velocity in a second direction that is parallel to the first direction.
    Type: Application
    Filed: December 1, 2021
    Publication date: June 23, 2022
    Applicant: KLA Corporation
    Inventors: Tomas Plettner, Doug Larson, Mark Cawein, Jason W. Huang
  • Patent number: 7300575
    Abstract: A filter system for receiving an aqueous-based fluid contaminated with particles and emulsified contaminant oil, removing the particles, and separating the emulsified contaminant oil from the aqueous-based fluid includes a filter media for receiving the aqueous-based fluid and emulsified contaminant oil, having an inner filter element formed from a 95 percent single pass efficiency 48 micron (5 micron nominal) filtering material of needle punch polypropylene felt, an outer filter element formed from a 95 percent single pass efficiency 19 micron absolute filtering material of a polypropylene microfiber material and a porous spunbond polypropylene sandwiching the outer filter media.
    Type: Grant
    Filed: June 16, 2004
    Date of Patent: November 27, 2007
    Assignee: Heritage Crystal Clean, LLC
    Inventor: Doug Larson
  • Publication number: 20050279717
    Abstract: A filter system for receiving an aqueous-based fluid contaminated with particles and emulsified contaminant oil, removing the particles, and separating the emulsified contaminant oil from the aqueous-based fluid includes a filter media for receiving the aqueous-based fluid and emulsified contaminant oil, having an inner filter element formed from a 95 percent single pass efficiency 48 micron (5 micron nominal) filtering material of needle punch polypropylene felt, an outer filter element formed from a 95 percent single pass efficiency 19 micron absolute filtering material of a polypropylene microfiber material and a porous spunbond polypropylene sandwiching the outer filter media.
    Type: Application
    Filed: June 16, 2004
    Publication date: December 22, 2005
    Inventor: Doug Larson
  • Patent number: 6934896
    Abstract: A time shift circuit for changing a delay timing of a portion of a test pattern for testing a semiconductor device. The time shift circuit includes a multiplexer for selectively producing delay value data indicating a value of time shift in response to a shift command signal, a vernier delay unit for producing timing vernier data based on the delay value data selected by the multiplexer, and a timing generator for generating a timing edge for the specific portion of the test pattern based on the timing vernier data from the vernier delay unit. The shift command signal sets either a normal mode where predetermined delay value data is selected by the multiplexer or a time shift mode where delay value data for shifting the timing edge in real time is selected by the multiplexer.
    Type: Grant
    Filed: December 31, 2001
    Date of Patent: August 23, 2005
    Assignee: Advantest Corp.
    Inventors: Doug Larson, Anthony Le
  • Publication number: 20030126530
    Abstract: A time shift circuit for changing a delay timing of a portion of a test pattern for testing a semiconductor device. The time shift circuit includes a multiplexer for selectively producing delay value data indicating a value of time shift in response to a shift command signal, a vernier delay unit for producing timing vernier data based on the delay value data selected by the multiplexer, and a timing generator for generating a timing edge for the specific portion of the test pattern based on the timing vernier data. The shift command signal sets either a normal mode where predetermined delay value data is selected by the multiplexer or a time shift mode where delay value data for shifting the timing edge in real time is selected by the multiplexer.
    Type: Application
    Filed: December 31, 2001
    Publication date: July 3, 2003
    Inventors: Doug Larson, Anthony Le