Abstract: The invention relates to a method for measuring the detection sensitivity of an x-ray device for recognizing foreign matter in a product, the x-ray device having a detector, the detection signal of which results in a detection image having a defined resolution, the detection image being evaluated in order to recognize foreign matter. In a test-body analysis phase, which is used to define the parameters for the product inspection, the damping of the detection signal in the detection image of the product by a test body of defined material and of defined size is measured and stored in the form of damping values. During the product inspection, the detection image of the product is offset at a plurality of positions using the stored damping values of the test body to determine the detection sensitivity.