Patents by Inventor Douglas B. Lebo

Douglas B. Lebo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Statistical system and method for testing integrated circuits
    Patent number: 6255841
    Abstract: A system for, and method of, testing a sample integrated circuit (IC) and a test apparatus incorporating the system or the method. The sample IC includes symmetrical circuits having corresponding intrinsic leakages that depend upon a process employed to manufacture the sample IC. In one embodiment, the system includes: (1) data storage circuitry that contains data derived statistically from exemplary ICs manufactured according to the process and determined to be acceptable and (2) test circuitry, associated with the data storage circuitry, that measures the corresponding intrinsic leakages to determine whether the sample IC is acceptable.
    Type: Grant
    Filed: May 20, 1999
    Date of Patent: July 3, 2001
    Assignee: Lucent Technologies, Inc.
    Inventors: Douglas B. Lebo, John M. Siket, Michael A. Washko