Patents by Inventor Douglas C. Kimbrough

Douglas C. Kimbrough has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for identifying broken pins in a test socket
    Patent number: 8040140
    Abstract: A method includes scanning a test socket after removal of a device under test to generate scan data. The scan data is compared to reference data. A presence of at least a portion of a pin in the test socket is identified based on the comparison. A test system includes a test socket, a scanner, and a control unit. The test socket is operable to receive devices under test. The scanner is operable to scan a test socket after removal of a device under test to generate scan data. The control unit is operable to compare the scan data to reference data and identify a presence of at least a portion of a pin in the test socket based on the comparison.
    Type: Grant
    Filed: November 15, 2010
    Date of Patent: October 18, 2011
    Assignee: GLOBALFOUNDRIES, Inc.
    Inventors: Matthew S. Ryskoski, Christopher L. Wooten, Song Han, Douglas C. Kimbrough
  • Method and apparatus for employing previous test insertion results for testing a device
    Patent number: 7983871
    Abstract: A method includes determining at least a first characteristic of a device during a first test insertion and storing the first characteristic. The device is identified during a second test insertion. The first characteristic is retrieved responsive to the identification of the device. A test program for the second insertion is configured based on the first characteristic. The configured test program is executed to test the device during the second test insertion.
    Type: Grant
    Filed: September 4, 2007
    Date of Patent: July 19, 2011
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Douglas C. Kimbrough, Michael A. Retersdorf, Kevin R. Lensing
  • METHOD AND APPARATUS FOR IDENTIFYING BROKEN PINS IN A TEST SOCKET
    Publication number: 20110057666
    Abstract: A method includes scanning a test socket after removal of a device under test to generate scan data. The scan data is compared to reference data. A presence of at least a portion of a pin in the test socket is identified based on the comparison. A test system includes a test socket, a scanner, and a control unit. The test socket is operable to receive devices under test. The scanner is operable to scan a test socket after removal of a device under test to generate scan data. The control unit is operable to compare the scan data to reference data and identify a presence of at least a portion of a pin in the test socket based on the comparison.
    Type: Application
    Filed: November 15, 2010
    Publication date: March 10, 2011
    Inventors: Matthew S. Ryskoski, Christopher L. Wooten, Song Han, Douglas C. Kimbrough
  • Method and apparatus for dynamically determining tester recipes
    Patent number: 7774670
    Abstract: A method includes retrieving a group test parameter determined based on test results associated with a plurality of integrated circuit devices. A particular integrated circuit device is tested using a test program and the group test parameter.
    Type: Grant
    Filed: September 11, 2007
    Date of Patent: August 10, 2010
    Assignee: GLOBALFOUNDRIES Inc.
    Inventors: Richard J. Markle, Douglas C. Kimbrough, Eric O. Green, Robert J. Chong
  • METHOD AND APPARATUS FOR DYNAMICALLY DETERMINING TESTER RECIPES
    Publication number: 20090070644
    Abstract: A method includes retrieving a group test parameter determined based on test results associated with a plurality of integrated circuit devices. A particular integrated circuit device is tested using a test program and the group test parameter.
    Type: Application
    Filed: September 11, 2007
    Publication date: March 12, 2009
    Inventors: RICHARD J. MARKLE, Douglas C. Kimbrough, Eric O. Green, Robert Chong
  • METHOD AND APPARATUS FOR EMPLOYING PREVIOUS TEST INSERTION RESULTS FOR TESTING A DEVICE
    Publication number: 20090058449
    Abstract: A method includes determining at least a first characteristic of a device during a first test insertion and storing the first characteristic. The device is identified during a second test insertion. The first characteristic is retrieved responsive to the identification of the device. A test program for the second insertion is configured based on the first characteristic. The configured test program is executed to test the device during the second test insertion.
    Type: Application
    Filed: September 4, 2007
    Publication date: March 5, 2009
    Inventors: Douglas C. Kimbrough, Michael A. Retersdorf, Kevin R. Lensing
  • METHOD AND APPARATUS FOR IDENTIFYING BROKEN PINS IN A TEST SOCKET
    Publication number: 20080258704
    Abstract: A method includes scanning a test socket after removal of a device under test to generate scan data. The scan data is compared to reference data. A presence of at least a portion of a pin in the test socket is identified based on the comparison. A test system includes a test socket, a scanner, and a control unit. The test socket is operable to receive devices under test. The scanner is operable to scan a test socket after removal of a device under test to generate scan data. The control unit is operable to compare the scan data to reference data and identify a presence of at least a portion of a pin in the test socket based on the comparison.
    Type: Application
    Filed: April 23, 2007
    Publication date: October 23, 2008
    Inventors: Matthew S. Ryskoski, Christopher L. Wooten, Song Han, Douglas C. Kimbrough