Abstract: A pixel sensing subsystem for a solid state image sensor includes frame timing logic that produces a frame timing signal indicative of an end-of-frame time and a beginning-of-frame time and reset logic that produces a reset signal for a charge accumulator of pixel sensing electronics. The reset logic asserts the reset signal at least once between the end-of-frame time and the beginning-of-frame time to prevent saturation of the pixel sensing element.

Abstract: A pixel sensing subsystem (110) for a solid state image sensor includes frame timing logic (114) that produces a frame timing signal indicative of an end-of-frame time and a beginning-of-frame time and reset logic (116) that produces a reset signal for a charge accumulator of pixel sensing electronics. The reset logic (116) asserts the reset signal at least once between the end-of-frame time and the beginning-of-frame time to prevent saturation of the pixel sensing element.

Abstract: A pixel sensing subsystem for a solid state image sensor includes frame timing logic that produces a frame timing signal indicative of an end-of-frame time and a beginning-of-frame time and reset logic that produces a reset signal for a charge accumulator of pixel sensing electronics. The reset logic asserts the reset signal at least once between the end-of-frame time and the beginning-of-frame time to prevent saturation of the pixel sensing element.

Abstract: A method and apparatus for correcting the offset induced by Field Effect Transistor (FET) photo-conductive effects in solid state x-ray detectors includes dedicating rows at the beginning and end of an x-ray detector scan. The dedicated rows may be used to measure the “signal” induced by the photo-conductivity of FET switches in solid state x-ray detectors. Since the signal induced by FET photo-conductivity decays over time, the measurements taken at the beginning and end of a detector scan may be used to predict by interpolation the amount of signal contributed by photo-conductive induced offset for each row of the detector scan on a column by column basis.

Abstract: A method and apparatus for correcting the offset induced by Field Effect Transistor (FET) photo-conductive effects in solid state x-ray detectors includes dedicating rows at the beginning and end of an x-ray detector scan. The dedicated rows may be used to measure the “signal” induced by the photo-conductivity of FET switches in solid state x-ray detectors. Since the signal induced by FET photo-conductivity decays over time, the measurements taken at the beginning and end of a detector scan may be used to predict by interpolation the amount of signal contributed by photo-conductive induced offset for each row of the detector scan on a column by column basis.

Abstract: A technique is provided for increasing the pixel pitch without increasing the interconnect density of a digital detector. Generally, a digital detector has an array of rows and columns of pixels, read out electronics and scan electronics, that are configured to generate and transmit signals based upon radiation impacting the detector. The detector also having a plurality of scan lines, which are coupled to the plurality of rows of pixels. The present technique also provides a multiplexing circuit for selectively coupling the rows of pixels to the respective scan lines for read out of the signals.

Abstract: A technique is provided for increasing the pixel pitch without increasing the interconnect density of a digital detector. Generally, a digital detector has an array of rows and columns of pixels, read out electronics and scan electronics, that are configured to generate and transmit signals based upon radiation impacting the detector. The detector also having a plurality of scan lines, which are coupled to the plurality of rows of pixels. The present technique also provides a multiplexing circuit for selectively coupling the rows of pixels to the respective scan lines for read out of the signals.

Abstract: A method and apparatus for correcting the offset induced by Field Effect Transistor (FET) photo-conductive effects in solid state x-ray detectors includes dedicating rows at the beginning and end of an x-ray detector scan. The dedicated rows may be used to measure the “signal” induced by the photo-conductivity of FET switches in solid state x-ray detectors. Since the signal induced by FET photo-conductivity decays over time, the measurements taken at the beginning and end of a detector scan may be used to predict by interpolation the amount of signal contributed by photo-conductive induced offset for each row of the detector scan on a column by column basis.