Patents by Inventor Douglas P. Knapp

Douglas P. Knapp has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Use of eddy current to non-destructively measure crack depth
    Patent number: 6563309
    Abstract: A method and apparatus for non-destructively measuring the depth of a crack with precision and accuracy in a workpiece using an eddy current process. The method involves empirically creating a response curve of the eddy current response produced from crack(s) in a sample workpiece(s), wherein the depth of the crack(s) in the sample workpiece(s) may be modified a plurality of times and an eddy current response reading is taken at each different crack depth. The response curve is then used to interpolate the depth of a crack in a workpiece composed of the same material non-destructively by measuring the eddy current response in the workpiece crack and then obtaining the predetermined crack depth value form the response curve.
    Type: Grant
    Filed: September 28, 2001
    Date of Patent: May 13, 2003
    Assignee: The Boeing Company
    Inventors: James S. Kachelries, Louis R. Truckley, Douglas P. Knapp
  • USE OF EDDY CURRENT TO NON-DESTRUCTIVELY MEASURE CRACK DEPTH
    Publication number: 20030062892
    Abstract: A method and apparatus for non-destructively measuring the depth of a crack with precision and accuracy in a workpiece using an eddy current process. The method involves empirically creating a response curve of the eddy current response produced from crack(s) in a sample workpiece(s), wherein the depth of the crack(s) in the sample workpiece(s) may be modified a plurality of times and an eddy current response reading is taken at each different crack depth. The response curve is then used to interpolate the depth of a crack in a workpiece composed of the same material non-destructively by measuring the eddy current response in the workpiece crack and then obtaining the predetermined crack depth value form the response curve.
    Type: Application
    Filed: September 28, 2001
    Publication date: April 3, 2003
    Inventors: James S. Kachelries, Louis R. Truckley, Douglas P. Knapp